name:-0.17179298400879
name:-0.11367201805115
name:-0.045390844345093
TOYO Corporation Patent Filings

TOYO Corporation

Patent Applications and Registrations

Patent applications and USPTO patent grants for TOYO Corporation.The latest application filed is for "system, device, method, and program for analysis".

Company Profile
9.13.13
  • TOYO Corporation - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
System, Device, Method, And Program For Analysis
App 20220252646 - LI; Congbing ;   et al.
2022-08-11
Related Interference Wave Presentation Device And Method
App 20220107348 - SUETSUGU; Kentaro ;   et al.
2022-04-07
Packet capture device and packet capture method
Grant 11,296,958 - Ogita April 5, 2
2022-04-05
Spectrum analysis method and spectrum analysis apparatus
Grant 11,268,857 - Nakamura , et al. March 8, 2
2022-03-08
Packet Capture Device And Packet Capture Method
App 20220045918 - OGITA; Keiichi
2022-02-10
Radiated emission measurement method and radiated emission measurement system
Grant 11,175,327 - Nakamura , et al. November 16, 2
2021-11-16
Radiated Emission Measurement Method And Radiated Emission Measurement System
App 20210325438 - NAKAMURA; Tetsuya ;   et al.
2021-10-21
Spectrum Analysis Method And Spectrum Analysis Apparatus
App 20210325247 - NAKAMURA; Tetsuya ;   et al.
2021-10-21
Measuring Container, Measuring System And Measuring Method
App 20200348253 - Inoue; Masaru ;   et al.
2020-11-05
Data writing device and method
Grant 10,585,622 - Saitoh , et al.
2020-03-10
Dynamometer load device
Grant 10,564,058 - Kiuchi , et al. Feb
2020-02-18
Dynamometer Load Device
App 20190383680 - KIUCHI; Takeo ;   et al.
2019-12-19
Data Writing Device And Method
App 20190369907 - SAITOH; Yoshiyuki ;   et al.
2019-12-05
Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
Grant 9,158,140 - Inoue , et al. October 13, 2
2015-10-13
Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
Grant 8,212,582 - Inoue , et al. July 3, 2
2012-07-03
Physical Property Measuring Method for TFT Liquid Crystal Panel and Physical Property Measuring Apparatus for TFT Liquid Crystal Panel
App 20110121854 - Inoue; Masaru ;   et al.
2011-05-26
Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
Grant 7,893,707 - Inoue , et al. February 22, 2
2011-02-22
Physical Property Measuring Method for TFT Liquid Crystal Panel and Physical Property Measuring Apparatus for TFT Liquid Crystal Panel
App 20090267614 - Inoue; Masaru ;   et al.
2009-10-29
Selective memory transaction monitor system
Grant 5,377,344 - Stager , et al. December 27, 1
1994-12-27
Company Registrations

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