Toyama; Kiyoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Toyama; Kiyoshi.The latest application filed is for "optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method".
- Toyama; Kiyoshi - Mito-shi JP
- Toyama; Kiyoshi - Gifu-ken JP
- Toyama; Kiyoshi - Gifu JP
| Patent | Date |
|---|---|
| Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method App 20100177290 - Toyama; Kiyoshi ; et al. | 2010-07-15 |
| Method of manufacturing magnetic patterns Grant 5,580,639 - Togawa , et al. December 3, 1 | 1996-12-03 |
| Method of manufacturing a medium having a magnetic pattern Grant 5,527,663 - Togawa , et al. June 18, 1 | 1996-06-18 |
| Method of manufacturing article having magnetic patterns Grant 5,445,707 - Toyama , et al. August 29, 1 | 1995-08-29 |
| Optical position sensor using Faraday effect element and magnetic scale Grant 4,931,635 - Toyama June 5, 1 | 1990-06-05 |
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