TOYA; Kenichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for TOYA; Kenichi.The latest application filed is for "analysis device, analysis method, non-transient computer-readable recording medium stored with program, and calibration method".
- TOYA; Kenichi - Saitama JP
| Patent | Date |
|---|---|
| Analysis Device, Analysis Method, Non-transient Computer-readable Recording Medium Stored With Program, And Calibration Method App 20210343028 - IKEUCHI; Yasushi ; et al. | 2021-11-04 |
| Manufacturing method of field emission cathode Grant 8,172,634 - Nishijima , et al. May 8, 2 | 2012-05-08 |
| Manufacturing Method of Field Emission Cathode App 20110143626 - Nishijima; Mitsutaka ; et al. | 2011-06-16 |
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