Toth; Gabor D.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Toth; Gabor D..The latest application filed is for "charged-particle energy analyzer".
- Toth; Gabor D. - Gilroy CA
- Toth; Gabor D. - San Jose CA US
| Patent | Date |
|---|---|
| Virtual ground for target substrate using floodgun and feedback control Grant 9,666,411 - McCord , et al. May 30, 2 | 2017-05-30 |
| Charged-particle energy analyzer Grant 8,421,030 - Shadman , et al. April 16, 2 | 2013-04-16 |
| Charged-particle Energy Analyzer App 20110168886 - Shadman; Khashayar ; et al. | 2011-07-14 |
| Defect review using image segmentation Grant 7,792,351 - Toth , et al. September 7, 2 | 2010-09-07 |
| Auger electron spectrometer with applied magnetic field at target surface Grant 7,755,042 - Toth , et al. July 13, 2 | 2010-07-13 |
| Defect review using image segmentation Grant 7,684,609 - Toth , et al. March 23, 2 | 2010-03-23 |
| Automated focusing of electron image Grant 7,247,849 - Toth , et al. July 24, 2 | 2007-07-24 |
| Wien filter with reduced chromatic aberration Grant 7,164,139 - Toth , et al. January 16, 2 | 2007-01-16 |
| Apparatus and method for E-beam dark field imaging Grant 7,141,791 - Masnaghetti , et al. November 28, 2 | 2006-11-28 |
| Automated focusing of electron image Grant 7,041,976 - Neil , et al. May 9, 2 | 2006-05-09 |
| Apparatus and method for e-beam dark field imaging App 20060060780 - Masnaghetti; Douglas K. ; et al. | 2006-03-23 |
| Single tool defect classification solution Grant 6,952,653 - Toth , et al. October 4, 2 | 2005-10-04 |
| Single tool defect classification solution App 20050033528 - Toth, Gabor D. ; et al. | 2005-02-10 |
| Apparatus and methods of controlling surface charge and focus Grant 6,828,571 - McCord , et al. December 7, 2 | 2004-12-07 |
| Dual electron beam instrument for multi-perspective Grant 6,812,462 - Toth , et al. November 2, 2 | 2004-11-02 |
| Filtered e-beam inspection and review Grant 6,797,955 - Adler , et al. September 28, 2 | 2004-09-28 |
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