Tortonese; Marco
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tortonese; Marco.The latest application filed is for "steerable stylet".
- Tortonese; Marco - Mountain View CA
- Tortonese; Marco - Stanford CA
- Tortonese; Marco - Standford CA
| Patent | Date |
|---|---|
| Steerable Stylet App 20160096013 - Tortonese; Marco ; et al. | 2016-04-07 |
| Steerable stylet Grant 9,211,403 - Tortonese , et al. December 15, 2 | 2015-12-15 |
| Verification of computer simulation of photolithographic process Grant 8,943,443 - Tortonese , et al. January 27, 2 | 2015-01-27 |
| Verification of computer simulation of photolithographic process Grant 8,245,161 - Tortonese , et al. August 14, 2 | 2012-08-14 |
| Steerable Stylet App 20110106101 - Tortonese; Marco ; et al. | 2011-05-05 |
| Calibration standard for a dual beam (FIB/SEM) machine Grant 7,576,317 - Tortonese , et al. August 18, 2 | 2009-08-18 |
| Dimensional calibration standards Grant 7,453,571 - Tortonese , et al. November 18, 2 | 2008-11-18 |
| Atomic force microscope Grant 7,423,264 - Bevis , et al. September 9, 2 | 2008-09-09 |
| Calibration standard for a dual beam (FIB/SEM) machine Grant 7,372,016 - Tortonese , et al. May 13, 2 | 2008-05-13 |
| Atomic force microscope App 20080060426 - Bevis; Christoper F. ; et al. | 2008-03-13 |
| Dimensional calibration standards Grant 7,301,638 - Tortonese , et al. November 27, 2 | 2007-11-27 |
| Structure and method for mounting a small sample in an opening in a larger substrate Grant 6,821,812 - Tortonese , et al. November 23, 2 | 2004-11-23 |
| Submicron dimensional calibration standards and methods of manufacture and use Grant 6,646,737 - Tortonese , et al. November 11, 2 | 2003-11-11 |
| Submicron dimensional calibration standards and methods of manufacture and use App 20030058437 - Tortonese, Marco ; et al. | 2003-03-27 |
| Voice coil scanner for use in scanning probe microscope Grant 6,005,251 - Alexander , et al. December 21, 1 | 1999-12-21 |
| Atomic force microscope for attachment to optical microscope Grant 5,861,624 - Alexander , et al. January 19, 1 | 1999-01-19 |
| Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector Grant 5,595,942 - Albrecht , et al. January 21, 1 | 1997-01-21 |
| Cantilever and method of using same to detect features on a surface Grant 5,483,822 - Albrecht , et al. * January 16, 1 | 1996-01-16 |
| Piezoresistive cantilever with integral tip for scanning probe microscope Grant 5,444,244 - Kirk , et al. August 22, 1 | 1995-08-22 |
| Atomic force microscope having cantilever with piezoresistive deflection sensor Grant 5,345,815 - Albrecht , et al. September 13, 1 | 1994-09-13 |
| Nitride cantilevers with single crystal silicon tips Grant 5,066,358 - Quate , et al. November 19, 1 | 1991-11-19 |
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