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Patent applications and USPTO patent grants for Torreiter; Otto A..The latest application filed is for "on-chip hardware-controlled window strobing".
Patent | Date |
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On-chip hardware-controlled window strobing Grant 10,288,684 - Gentner , et al. | 2019-05-14 |
On-chip hardware-controlled window strobing Grant 10,281,527 - Gentner , et al. | 2019-05-07 |
On-chip Hardware-controlled Window Strobing App 20180364309 - Gentner; Thomas ;   et al. | 2018-12-20 |
On-chip Hardware-controlled Window Strobing App 20180364308 - Gentner; Thomas ;   et al. | 2018-12-20 |
Method for electrical testing of a 3-D chip stack Grant 10,114,069 - Eckert , et al. October 30, 2 | 2018-10-30 |
Layout effect characterization for integrated circuits Grant 10,114,914 - Eckert , et al. October 30, 2 | 2018-10-30 |
Layout Effect Characterization For Integrated Circuits App 20180107771 - Eckert; Martin ;   et al. | 2018-04-19 |
Layout effect characterization for integrated circuits Grant 9,904,748 - Eckert , et al. February 27, 2 | 2018-02-27 |
Layout effect characterization for integrated circuits Grant 9,740,813 - Eckert , et al. August 22, 2 | 2017-08-22 |
Measuring power consumption in an integrated circuit Grant 9,709,625 - Eckert , et al. July 18, 2 | 2017-07-18 |
Method for performing built-in self-tests Grant 9,679,665 - Eckert , et al. June 13, 2 | 2017-06-13 |
RAM at speed flexible timing and setup control Grant 9,627,090 - Eckert , et al. April 18, 2 | 2017-04-18 |
RAM at speed flexible timing and setup control Grant 9,627,017 - Eckert , et al. April 18, 2 | 2017-04-18 |
Determining categories for memory fail conditions Grant 9,620,244 - Eckert , et al. April 11, 2 | 2017-04-11 |
Ram At Speed Flexible Timing And Setup Control App 20170092377 - Eckert; Martin ;   et al. | 2017-03-30 |
Ram At Speed Flexible Timing And Setup Control App 20170092341 - Eckert; Martin ;   et al. | 2017-03-30 |
Soldering three dimensional integrated circuits Grant 9,496,188 - Eckert , et al. November 15, 2 | 2016-11-15 |
Soldering Three Dimensional Integrated Circuits App 20160293497 - Eckert; Martin ;   et al. | 2016-10-06 |
Determining categories for memory fail conditions Grant 9,401,222 - Eckert , et al. July 26, 2 | 2016-07-26 |
Ball grid array configuration for reliable testing Grant 9,322,848 - Torreiter , et al. April 26, 2 | 2016-04-26 |
System For Electrical Testing And Manufacturing Of A 3-d Chip Stack And Method App 20160097807 - ECKERT; Martin ;   et al. | 2016-04-07 |
System for electrical testing and manufacturing of a 3-D chip stack and method Grant 9,250,289 - Eckert , et al. February 2, 2 | 2016-02-02 |
Ball grid array configuration for reliable testing Grant 9,217,758 - Torreiter , et al. December 22, 2 | 2015-12-22 |
Network power fault detection Grant 9,094,306 - Eckert , et al. July 28, 2 | 2015-07-28 |
Ball Grid Array Configuration For Reliable Testing App 20150008949 - Torreiter; Otto A. ;   et al. | 2015-01-08 |
Ball Grid Array Configuration For Reliable Testing App 20150008947 - Torreiter; Otto A. ;   et al. | 2015-01-08 |
System For Electrical Testing And Manufacturing Of A 3-d Chip Stack And Method App 20140300382 - ECKERT; Martin ;   et al. | 2014-10-09 |
Method and system for performing self-tests in an electronic system Grant 8,659,310 - Eckert , et al. February 25, 2 | 2014-02-25 |
Network Power Fault Detection App 20130343200 - Eckert; Martin ;   et al. | 2013-12-26 |
Measuring Power Consumption In An Integrated Circuit App 20120130657 - ECKERT; Martin ;   et al. | 2012-05-24 |
Method And System For Performing Self-Tests In An Electronic System App 20120013356 - Eckert; Martin ;   et al. | 2012-01-19 |
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