Toraya; Hideo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Toraya; Hideo.The latest application filed is for "method and device for analyzing diffractionpattern of mixture, and information storage medium".

Company Profile

3.9.11

Toraya; Hideo - Akishima JP
TORAYA; Hideo - Tokyo JP
Toraya; Hideo - Tachikawa JP
Toraya, Hideo - Tachikawa-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases Grant 11,402,341 - Toraya , et al. August 2, 2	2022-08-02
Method And Device For Analyzing Diffractionpattern Of Mixture, And Information Storage Medium App 20220187225 - TORAYA; Hideo	2022-06-16
Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program Grant 10,962,489 - Toraya , et al. March 30, 2	2021-03-30
Quantitative Phase Analysis Device For Analyzing Non-Crystalline Phases, Quantitative Phase Analysis Method For Analyzing Non-Crystalline Phases, And Non-Transitory Computer-Readable Storage Medium Storing Quantitative Phase Analysis Program For Analyzing Non-Crystalline Phases App 20210018452 - Toraya; Hideo ; et al.	2021-01-21
Quantitative Phase Analysis Device, Quantitative Phase Analysis Method, And Non-transitory Computer-readable Storage Medium Stor App 20200173938 - TORAYA; Hideo ; et al.	2020-06-04
Crystalline Quantitative Phase Analysis Device, Crystalline Quantitative Phase Analysis Method, And Crystalline Quantitative Phase Analysis Program App 20180364183 - Toraya; Hideo ; et al.	2018-12-20
Method and its apparatus for x-ray diffraction Grant 9,417,195 - Toraya , et al. August 16, 2	2016-08-16
X-ray stress measuring apparatus Grant 9,146,203 - Toraya , et al. September 29, 2	2015-09-29
Method And Its Apparatus For X-ray Diffraction App 20130129052 - Toraya; Hideo ; et al.	2013-05-23
X-ray Stress Measuring Apparatus App 20130121470 - Toraya; Hideo ; et al.	2013-05-16
X-ray diffraction method and X-ray diffraction apparatus Grant 8,340,248 - Toraya , et al. December 25, 2	2012-12-25
X-ray Diffraction Method And X-ray Diffraction Apparatus App 20100246768 - TORAYA; Hideo ; et al.	2010-09-30
X-ray diffraction apparatus and X-ray diffraction method Grant 7,801,272 - Toraya September 21, 2	2010-09-21
X-ray Diffraction Apparatus And X-ray Diffraction Method App 20090086921 - TORAYA; Hideo	2009-04-02
Method of estimating preferred orientation of polycrystalline material Grant 6,873,681 - Toraya , et al. March 29, 2	2005-03-29
Method of estimating preferred orientation of polycrystalline material App 20030235270 - Toraya, Hideo ; et al.	2003-12-25

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