Tooma; Masahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tooma; Masahiro.The latest application filed is for "system for attitude control of underwater vehicle and method for attitude control of underwater vehicle".

Company Profile

0.9.6

Tooma; Masahiro - Tokyo JP
Tooma; Masahiro - Hitachiohta N/A JP
Tooma; Masahiro - Hitachiota N/A JP
Tooma; Masahiro - Kanasago JP
Tooma; Masahiro - Hitachi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and device for monitoring status of turbine blades Grant 9,689,660 - Nishimizu , et al. June 27, 2	2017-06-27
System for attitude control of underwater vehicle and method for attitude control of underwater vehicle Grant 9,334,031 - Mori , et al. May 10, 2	2016-05-10
System for Attitude Control of Underwater Vehicle and Method for Attitude Control of Underwater Vehicle App 20150090175 - MORI; Hayato ; et al.	2015-04-02
Method and Device for Monitoring Status of Turbine Blades App 20150002143 - NISHIMIZU; Akira ; et al.	2015-01-01
System and method for detecting position of underwater vehicle Grant 8,655,022 - Kobayashi , et al. February 18, 2	2014-02-18
Water jet peening method and apparatus thereof Grant 8,387,427 - Matsui , et al. March 5, 2	2013-03-05
Water Jet Peening Method and Apparatus Thereof App 20110005288 - MATSUI; Yuji ; et al.	2011-01-13
System And Method For Detecting Position Of Underwater Vehicle App 20100226541 - KOBAYASHI; Ryosuke ; et al.	2010-09-09
Ultrasonic flaw detecting method and ultrasonic flaw detector Grant 7,093,490 - Kono , et al. August 22, 2	2006-08-22
Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method Grant 6,957,583 - Tooma , et al. October 25, 2	2005-10-25
Ultrasonic flaw detecting method and ultrasonic flaw detector App 20050183505 - Kono, Naoyuki ; et al.	2005-08-25
Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method App 20040118210 - Tooma, Masahiro ; et al.	2004-06-24
Laser plasma x-ray source, semiconductor lithography apparatus using the same and a method thereof Grant 5,991,360 - Matsui , et al. November 23, 1	1999-11-23

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