Tonouchi; Masayoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tonouchi; Masayoshi.The latest application filed is for "modification processing device, modification monitoring device and modification processing method".

Company Profile

0.19.20

Tonouchi; Masayoshi - Suita JP
Tonouchi; Masayoshi - Osaka JP
TONOUCHI; Masayoshi - Suita-shi JP
Tonouchi; Masayoshi - Mino JP
Tonouchi; Masayoshi - Mino-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection apparatus and inspection method Grant 10,158,325 - Nakanishi , et al. Dec	2018-12-18
Modification processing device, modification monitoring device and modification processing method Grant 10,001,441 - Nakanishi , et al. June 19, 2	2018-06-19
Photo device inspection apparatus and photo device inspection method Grant 9,651,607 - Nakanishi , et al. May 16, 2	2017-05-16
Inspecting device and inspecting method Grant 9,541,508 - Nakanishi , et al. January 10, 2	2017-01-10
Inspection apparatus and inspection method Grant 9,450,536 - Nakanishi , et al. September 20, 2	2016-09-20
Inspection apparatus and inspection method Grant 9,404,874 - Nakanishi , et al. August 2, 2	2016-08-02
Inspection apparatus and inspection method Grant 9,383,321 - Nakanishi , et al. July 5, 2	2016-07-05
Modification Processing Device, Modification Monitoring Device And Modification Processing Method App 20160093539 - NAKANISHI; Hidetoshi ; et al.	2016-03-31
Inspecting device and inspecting method Grant 9,234,934 - Nakanishi , et al. January 12, 2	2016-01-12
Inspecting device and inspecting method Grant 9,151,669 - Ito , et al. October 6, 2	2015-10-06
Inspection Apparatus And Inspection Method App 20150276607 - NAKANISHI; Hidetoshi ; et al.	2015-10-01
Inspection Apparatus And Inspection Method App 20150236642 - NAKANISHI; Hidetoshi ; et al.	2015-08-20
Inspection apparatus and inspection method Grant 9,103,870 - Nakanishi , et al. August 11, 2	2015-08-11
Inspection Appratus And Inspection Method App 20150162872 - NAKANISHI; Hidetoshi ; et al.	2015-06-11
Inspection Apparatus And Inspection Method App 20150053869 - NAKANISHI; Hidetoshi ; et al.	2015-02-26
Semiconductor inspection method and semiconductor inspection apparatus Grant 8,941,824 - Nakanishi , et al. January 27, 2	2015-01-27
Photo Device Inspection Apparatus And Photo Device Inspection Method App 20150015297 - Nakanishi; Hidetoshi ; et al.	2015-01-15
Inspection apparatus and inspection method Grant 8,872,114 - Nakanishi , et al. October 28, 2	2014-10-28
Inspecting Device And Inspecting Method App 20140253911 - Nakanishi; Hidetoshi ; et al.	2014-09-11
Inspecting Device And Inspecting Method App 20140239182 - ITO; Akira ; et al.	2014-08-28
Inspecting Device And Inspecting Method App 20140002125 - NAKANISHI; Hidetoshi ; et al.	2014-01-02
Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiation Grant 8,530,868 - Nakanishi , et al. September 10, 2	2013-09-10
Inspection Apparatus And Inspection Method App 20130222004 - NAKANISHI; Hidetoshi ; et al.	2013-08-29
Electromagnetic Radiation Generating Element, Electromagnetic Radiation Generating Device, And Method Of Generating Electromagnetic Radiation App 20130153793 - NAKANISHI; Hidetoshi ; et al.	2013-06-20
Semiconductor Inspection Method And Semiconductor Inspection Apparatus App 20130083319 - NAKANISHI; Hidetoshi ; et al.	2013-04-04
Inspection Apparatus And Inspection Method App 20130015368 - NAKANISHI; Hidetoshi ; et al.	2013-01-17
Semiconductor Inspection Device And Inspection Method App 20110216312 - Matsumoto; Toru ; et al.	2011-09-08
Electric-field distribution measurement method and apparatus for semiconductor device Grant 7,466,151 - Ohtake , et al. December 16, 2	2008-12-16
Method and apparatus for diagnosing fault in semiconductor device Grant 7,173,447 - Yamashita , et al. February 6, 2	2007-02-06
Method and device for measuring electric field distribution of semiconductor device App 20070018634 - Ohtake; Hideyuki ; et al.	2007-01-25
Method and apparatus for diagnosing fault in semiconductor device App 20060006886 - Yamashita; Masatsugu ; et al.	2006-01-12
Method and apparatus for inspecting wire breaking of integrated circuit Grant 6,980,010 - Tonouchi , et al. December 27, 2	2005-12-27
Method and apparatus for inspecting wire breaking of integrated circuit App 20040246011 - Tonouchi, Masayoshi ; et al.	2004-12-09

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