loadpatents
Patent applications and USPTO patent grants for Tonouchi; Masayoshi.The latest application filed is for "modification processing device, modification monitoring device and modification processing method".
Patent | Date |
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Inspection apparatus and inspection method Grant 10,158,325 - Nakanishi , et al. Dec | 2018-12-18 |
Modification processing device, modification monitoring device and modification processing method Grant 10,001,441 - Nakanishi , et al. June 19, 2 | 2018-06-19 |
Photo device inspection apparatus and photo device inspection method Grant 9,651,607 - Nakanishi , et al. May 16, 2 | 2017-05-16 |
Inspecting device and inspecting method Grant 9,541,508 - Nakanishi , et al. January 10, 2 | 2017-01-10 |
Inspection apparatus and inspection method Grant 9,450,536 - Nakanishi , et al. September 20, 2 | 2016-09-20 |
Inspection apparatus and inspection method Grant 9,404,874 - Nakanishi , et al. August 2, 2 | 2016-08-02 |
Inspection apparatus and inspection method Grant 9,383,321 - Nakanishi , et al. July 5, 2 | 2016-07-05 |
Modification Processing Device, Modification Monitoring Device And Modification Processing Method App 20160093539 - NAKANISHI; Hidetoshi ;   et al. | 2016-03-31 |
Inspecting device and inspecting method Grant 9,234,934 - Nakanishi , et al. January 12, 2 | 2016-01-12 |
Inspecting device and inspecting method Grant 9,151,669 - Ito , et al. October 6, 2 | 2015-10-06 |
Inspection Apparatus And Inspection Method App 20150276607 - NAKANISHI; Hidetoshi ;   et al. | 2015-10-01 |
Inspection Apparatus And Inspection Method App 20150236642 - NAKANISHI; Hidetoshi ;   et al. | 2015-08-20 |
Inspection apparatus and inspection method Grant 9,103,870 - Nakanishi , et al. August 11, 2 | 2015-08-11 |
Inspection Appratus And Inspection Method App 20150162872 - NAKANISHI; Hidetoshi ;   et al. | 2015-06-11 |
Inspection Apparatus And Inspection Method App 20150053869 - NAKANISHI; Hidetoshi ;   et al. | 2015-02-26 |
Semiconductor inspection method and semiconductor inspection apparatus Grant 8,941,824 - Nakanishi , et al. January 27, 2 | 2015-01-27 |
Photo Device Inspection Apparatus And Photo Device Inspection Method App 20150015297 - Nakanishi; Hidetoshi ;   et al. | 2015-01-15 |
Inspection apparatus and inspection method Grant 8,872,114 - Nakanishi , et al. October 28, 2 | 2014-10-28 |
Inspecting Device And Inspecting Method App 20140253911 - Nakanishi; Hidetoshi ;   et al. | 2014-09-11 |
Inspecting Device And Inspecting Method App 20140239182 - ITO; Akira ;   et al. | 2014-08-28 |
Inspecting Device And Inspecting Method App 20140002125 - NAKANISHI; Hidetoshi ;   et al. | 2014-01-02 |
Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiation Grant 8,530,868 - Nakanishi , et al. September 10, 2 | 2013-09-10 |
Inspection Apparatus And Inspection Method App 20130222004 - NAKANISHI; Hidetoshi ;   et al. | 2013-08-29 |
Electromagnetic Radiation Generating Element, Electromagnetic Radiation Generating Device, And Method Of Generating Electromagnetic Radiation App 20130153793 - NAKANISHI; Hidetoshi ;   et al. | 2013-06-20 |
Semiconductor Inspection Method And Semiconductor Inspection Apparatus App 20130083319 - NAKANISHI; Hidetoshi ;   et al. | 2013-04-04 |
Inspection Apparatus And Inspection Method App 20130015368 - NAKANISHI; Hidetoshi ;   et al. | 2013-01-17 |
Semiconductor Inspection Device And Inspection Method App 20110216312 - Matsumoto; Toru ;   et al. | 2011-09-08 |
Electric-field distribution measurement method and apparatus for semiconductor device Grant 7,466,151 - Ohtake , et al. December 16, 2 | 2008-12-16 |
Method and apparatus for diagnosing fault in semiconductor device Grant 7,173,447 - Yamashita , et al. February 6, 2 | 2007-02-06 |
Method and device for measuring electric field distribution of semiconductor device App 20070018634 - Ohtake; Hideyuki ;   et al. | 2007-01-25 |
Method and apparatus for diagnosing fault in semiconductor device App 20060006886 - Yamashita; Masatsugu ;   et al. | 2006-01-12 |
Method and apparatus for inspecting wire breaking of integrated circuit Grant 6,980,010 - Tonouchi , et al. December 27, 2 | 2005-12-27 |
Method and apparatus for inspecting wire breaking of integrated circuit App 20040246011 - Tonouchi, Masayoshi ;   et al. | 2004-12-09 |
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