Tomita; Masaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tomita; Masaki.The latest application filed is for "plating apparatus and operation control method of plating apparatus".

Company Profile

7.7.11

Tomita; Masaki - Tokyo JP
Tomita; Masaki - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Plating Apparatus And Operation Control Method Of Plating Apparatus App 20220205125 - Tomita; Masaki	2022-06-30
Plating Apparatus And Plating Method App 20220178046 - Tomita; Masaki ; et al.	2022-06-09
Permanent magnet Grant 11,335,484 - Tomita , et al. May 17, 2	2022-05-17
Cleaning device, plating device including the same, and cleaning method Grant 11,192,151 - Tomita , et al. December 7, 2	2021-12-07
Device For Measuring Bump Height, Apparatus For Processing Substrate, Method Of Measuring Bump Height, And Storage Medium App 20210285893 - Okuzono; Takahisa ; et al.	2021-09-16
Plating Device And Resistor App 20210277533 - SHAMOTO; MITSUHIRO ; et al.	2021-09-09
Inspection method, inspection device, and plating apparatus including the same Grant 11,008,668 - Tomita May 18, 2	2021-05-18
Permanent Magnet App 20210043344 - TOMITA; Masaki ; et al.	2021-02-11
Device for inspecting a bump height surrounded by resist, device for processing a substrate, method for inspecting a bump height, and storage medium Grant 10,910,334 - Okuzono , et al. February 2, 2	2021-02-02
Current measuring module using inspection substrate and inspection substrate Grant 10,830,834 - Tomita , et al. November 10, 2	2020-11-10
Substrate Holding Device App 20200258768 - A1	2020-08-13
Cleaning Device, Plating Device Including The Same, And Cleaning Method App 20200108423 - Tomita; Masaki ; et al.	2020-04-09
Device For Inspecting A Bump Height, Device For Processing A Substrate, Method For Inspecting A Bump Height, And Storage Medium App 20190348384 - OKUZONO; Takahisa ; et al.	2019-11-14
Inspection Method, Inspection Device, And Plating Apparatus Including The Same App 20190330758 - TOMITA; Masaki	2019-10-31
Permanent magnet Grant 10,366,814 - Ito , et al. July 30, 2	2019-07-30
Current Measuring Module Using Inspection Substrate And Inspection Substrate App 20190219627 - TOMITA; Masaki ; et al.	2019-07-18
Permanent Magnet App 20160276075 - ITO; Masashi ; et al.	2016-09-22
Reflection-type hologram scale and optical displacement measuring apparatus therewith Grant 6,115,153 - Tomita , et al. September 5, 2	2000-09-05

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