Tomimatsu; Satoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tomimatsu; Satoshi.The latest application filed is for "method of preparing thin film sample piece and charged particle beam apparatus".
Company Profile
11.86.81
- Tomimatsu; Satoshi - Tokyo JP
- TOMIMATSU; Satoshi - Minato-ku Tokyo
- Tomimatsu; Satoshi - Hitachinaka N/A JP
- Tomimatsu; Satoshi - Kokubunji N/A JP
- - Kokubunji JP
- Tomimatsu; Satoshi - Kokubunji-shi JP
- Tomimatsu; Satoshi - Kokunbunji JP
Patent Activity
| Patent | Date |
|---|---|
| Method of preparing thin film sample piece and charged particle beam apparatus Grant 11,094,503 - Suzuki , et al. August 17, 2 | 2021-08-17 |
| Charged particle beam device Grant 10,832,890 - Suzuki , et al. November 10, 2 | 2020-11-10 |
| Method Of Preparing Thin Film Sample Piece And Charged Particle Beam Apparatus App 20200266031 - SUZUKI; Masato ; et al. | 2020-08-20 |
| Charged Particle Beam Apparatus App 20200251303 - Kind Code | 2020-08-06 |
| Charged particle beam apparatus Grant 10,692,688 - Tomimatsu , et al. | 2020-06-23 |
| Charged particle beam apparatus Grant 10,658,147 - Sato , et al. | 2020-05-19 |
| Charged particle beam apparatus Grant 10,629,411 - Tomimatsu , et al. | 2020-04-21 |
| Charged Particle Beam Device App 20190304745 - SUZUKI; Masato ; et al. | 2019-10-03 |
| Charged Particle Beam Apparatus App 20190157037 - TOMIMATSU; Satoshi ; et al. | 2019-05-23 |
| Charged particle beam device and sample production method Grant 10,233,548 - Nanri , et al. | 2019-03-19 |
| Charged particle beam apparatus Grant 10,236,159 - Tomimatsu , et al. | 2019-03-19 |
| Charged Particle Beam Apparatus App 20180204704 - SUZUKI; Masato ; et al. | 2018-07-19 |
| Charged Particle Beam Apparatus App 20180204705 - TOMIMATSU; Satoshi ; et al. | 2018-07-19 |
| Control device, charged particle beam apparatus, program and method for producing processed product Grant 9,934,940 - Tomimatsu , et al. April 3, 2 | 2018-04-03 |
| Charged Particle Beam Apparatus App 20170278664 - SATO; Makoto ; et al. | 2017-09-28 |
| Control Device, Charged Particle Beam Apparatus, Program And Method For Producing Processed Product App 20170278673 - Tomimatsu; Satoshi ; et al. | 2017-09-28 |
| Charged Particle Beam Apparatus App 20170178858 - TOMIMATSU; Satoshi ; et al. | 2017-06-22 |
| Charged particle beam apparatus Grant 9,620,333 - Tomimatsu , et al. April 11, 2 | 2017-04-11 |
| Charged particle radiation device and specimen preparation method using said device Grant 9,449,786 - Tsuchiya , et al. September 20, 2 | 2016-09-20 |
| Charged particle beam device Grant 9,330,883 - Nanri , et al. May 3, 2 | 2016-05-03 |
| Charged Particle Radiation Device and Specimen Preparation Method Using Said Device App 20160071687 - TSUCHIYA; Miki ; et al. | 2016-03-10 |
| Charged Particle Beam Apparatus App 20160064187 - TOMIMATSU; Satoshi ; et al. | 2016-03-03 |
| Apparatus and method for probe shape processing by ion beam Grant 9,202,672 - Kitayama , et al. December 1, 2 | 2015-12-01 |
| Ion beam device and machining method Grant 9,111,721 - Kitayama , et al. August 18, 2 | 2015-08-18 |
| Charged Particle Beam Device App 20150014529 - Nanri; Terutaka ; et al. | 2015-01-15 |
| Charged particle beam device and sample production method Grant 8,933,423 - Nanri , et al. January 13, 2 | 2015-01-13 |
| Charged particle beam device, position specification method used for charged particle beam device, and program Grant 8,912,487 - Sakamoto , et al. December 16, 2 | 2014-12-16 |
| Method and apparatus for specimen fabrication Grant 8,796,651 - Shichi , et al. August 5, 2 | 2014-08-05 |
| Charged particle beam device and sample observation method using a rotating detector Grant 8,791,413 - Kitayama , et al. July 29, 2 | 2014-07-29 |
| Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,779,400 - Shichi , et al. July 15, 2 | 2014-07-15 |
| Charged particle beam apparatus and film thickness measurement method Grant 8,680,465 - Tomimatsu , et al. March 25, 2 | 2014-03-25 |
| Charged Particle Beam Device And Sample Production Method App 20140076717 - Nanri; Terutaka ; et al. | 2014-03-20 |
| Method and apparatus for processing a micro sample Grant 8,618,520 - Tokuda , et al. December 31, 2 | 2013-12-31 |
| Method and apparatus for processing a micro sample Grant 08618520 - | 2013-12-31 |
| Ion Beam Device And Machining Method App 20130334034 - Kitayama; Shinya ; et al. | 2013-12-19 |
| Ion Beam Processing Apparatus App 20130320209 - SHICHI; Hiroyasu ; et al. | 2013-12-05 |
| Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20130284593 - SHICHI; Hiroyasu ; et al. | 2013-10-31 |
| Method and apparatus for specimen fabrication Grant 8,569,719 - Tomimatsu , et al. October 29, 2 | 2013-10-29 |
| Charged Particle Beam Device And Method Of Manufacture Of Sample App 20130277552 - Nanri; Terutaka ; et al. | 2013-10-24 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,530,865 - Shichi , et al. September 10, 2 | 2013-09-10 |
| Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,481,980 - Shichi , et al. July 9, 2 | 2013-07-09 |
| Charged Particle Beam Device and Sample Observation Method App 20130146765 - Kitayama; Shinya ; et al. | 2013-06-13 |
| Electron beam device and electron beam application device using the same Grant 8,450,699 - Ohshima , et al. May 28, 2 | 2013-05-28 |
| Charged Particle Beam Device And Sample Production Method App 20130105302 - Nanri; Terutaka ; et al. | 2013-05-02 |
| Dual beam apparatus with tilting sample stage Grant 8,431,891 - Shichi , et al. April 30, 2 | 2013-04-30 |
| Method and apparatus for specimen fabrication Grant 8,405,053 - Tomimatsu , et al. March 26, 2 | 2013-03-26 |
| Ion Beam Apparatus And Ion-beam Processing Method App 20130032714 - Kitayama; Shinya ; et al. | 2013-02-07 |
| Method And Apparatus For Processing A Microsample App 20120273692 - TOKUDA; Mitsuo ; et al. | 2012-11-01 |
| Charged Particle Beam Device, Position Specification Method Used for Charged Particle Beam Device, and Program App 20120211652 - Sakamoto; Kunio ; et al. | 2012-08-23 |
| Charged Particle Beam Apparatus and Film Thickness Measurement Method App 20120187292 - Tomimatsu; Satoshi ; et al. | 2012-07-26 |
| Method and apparatus for processing a microsample Grant 8,222,618 - Tokuda , et al. July 17, 2 | 2012-07-17 |
| Gas Field Ion Source, Charged Particle Microscope, And Apparatus App 20120119086 - Shichi; Hiroyasu ; et al. | 2012-05-17 |
| Method And Apparatus For Specimen Fabrication App 20120085924 - Tomimatsu; Satoshi ; et al. | 2012-04-12 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,115,184 - Shichi , et al. February 14, 2 | 2012-02-14 |
| Electron Beam Device And Electron Beam Application Device Using The Same App 20110240855 - Ohshima; Takashi ; et al. | 2011-10-06 |
| ION Beam System and Machining Method App 20110204225 - Shichi; Hiroyasu ; et al. | 2011-08-25 |
| Method and apparatus for specimen fabrication Grant 7,999,240 - Tomimatsu , et al. August 16, 2 | 2011-08-16 |
| Apparatus and method for specimen fabrication Grant 7,989,782 - Tomimatsu , et al. August 2, 2 | 2011-08-02 |
| Method And Apparatus For Processing A Microsample App 20110174974 - TOKUDA; Mitsuo ; et al. | 2011-07-21 |
| Method And Apparatus For Specimen Fabrication App 20110140006 - Tomimatsu; Satoshi ; et al. | 2011-06-16 |
| Ion beam system and machining method Grant 7,952,083 - Shichi , et al. May 31, 2 | 2011-05-31 |
| Method and apparatus for specimen fabrication App 20110114476 - Shichi; Hiroyasu ; et al. | 2011-05-19 |
| Method and apparatus for specimen fabrication Grant 7,897,936 - Shichi , et al. March 1, 2 | 2011-03-01 |
| Method and apparatus for processing a micro sample Grant 7,888,639 - Tokuda , et al. February 15, 2 | 2011-02-15 |
| Method and apparatus for specimen fabrication Grant 7,791,050 - Tomimatsu , et al. September 7, 2 | 2010-09-07 |
| Ion Beam Processing Apparatus App 20100176297 - Shichi; Hiroyasu ; et al. | 2010-07-15 |
| Method for failure analysis and system for failure analysis Grant 7,725,278 - Tomimatsu , et al. May 25, 2 | 2010-05-25 |
| Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electronic device Grant 7,709,062 - Shichi , et al. May 4, 2 | 2010-05-04 |
| Ion beam processing apparatus Grant 7,700,931 - Shichi , et al. April 20, 2 | 2010-04-20 |
| Apparatus for ion beam fabrication Grant 7,696,496 - Tomimatsu , et al. April 13, 2 | 2010-04-13 |
| Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20090230299 - Shichi; Hiroyasu ; et al. | 2009-09-17 |
| Gas field ion source, charged particle microscope, and apparatus App 20090173888 - SHICHI; Hiroyasu ; et al. | 2009-07-09 |
| Method and apparatus for processing a micro sample Grant 7,550,750 - Tokuda , et al. June 23, 2 | 2009-06-23 |
| Apparatus And Method For Specimen Fabrication App 20090121158 - Tomimatsu; Satoshi ; et al. | 2009-05-14 |
| Focused ion beam apparatus for specimen fabrication Grant 7,525,108 - Tomimatsu , et al. April 28, 2 | 2009-04-28 |
| Apparatus and method for specimen fabrication Grant 7,482,603 - Tomimatsu , et al. January 27, 2 | 2009-01-27 |
| Method And Apparatus For Specimen Fabrication App 20090008578 - Tomimatsu; Satoshi ; et al. | 2009-01-08 |
| Method and apparatus for processing a micro sample Grant 7,470,918 - Tokuda , et al. December 30, 2 | 2008-12-30 |
| Method and apparatus for processing a micro sample Grant 7,465,945 - Tokuda , et al. December 16, 2 | 2008-12-16 |
| Method And Apparatus For Specimen Fabrication App 20080296516 - TOMIMATSU; Satoshi ; et al. | 2008-12-04 |
| Method And Apparatus For Specimen Fabrication App 20080296497 - TOMIMATSU; Satoshi ; et al. | 2008-12-04 |
| Apparatus for ion beam fabrication App 20080283778 - Tomimatsu; Satoshi ; et al. | 2008-11-20 |
| Method and apparatus for specimen fabrication App 20080191151 - Shichi; Hiroyasu ; et al. | 2008-08-14 |
| Method and apparatus for specimen fabrication Grant 7,397,051 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
| Method and apparatus for specimen fabrication Grant 7,397,052 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
| Method and apparatus for specimen fabrication Grant 7,397,050 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
| Ion Beam System And Machining method App 20080135779 - SHICHI; Hiroyasu ; et al. | 2008-06-12 |
| Method of preventing charging, and apparatus for charged particle beam using the same Grant 7,372,050 - Fukuda , et al. May 13, 2 | 2008-05-13 |
| Ion Beam Processing Apparatus App 20080073582 - Shichi; Hiroyasu ; et al. | 2008-03-27 |
| Method and apparatus for processing a micro sample App 20080067385 - Tokuda; Mitsuo ; et al. | 2008-03-20 |
| Ion beam system and machining method Grant 7,326,942 - Shichi , et al. February 5, 2 | 2008-02-05 |
| Probe driving method, and probe apparatus Grant 7,301,146 - Tomimatsu , et al. November 27, 2 | 2007-11-27 |
| Method and apparatus for specimen fabrication Grant 7,268,356 - Shichi , et al. September 11, 2 | 2007-09-11 |
| Method and apparatus for processing a micro sample App 20070181831 - Tokuda; Mitsuo ; et al. | 2007-08-09 |
| Method and apparatus for processing a micro sample App 20070158564 - Tokuda; Mitsuo ; et al. | 2007-07-12 |
| Method and apparatus for processing a micro sample App 20070158591 - Tokuda; Mitsuo ; et al. | 2007-07-12 |
| Method and apparatus for specimen fabrication App 20070145300 - Tomimatsu; Satoshi ; et al. | 2007-06-28 |
| Method and apparatus for specimen fabrication App 20070145301 - Tomimatsu; Satoshi ; et al. | 2007-06-28 |
| Method and apparatus for specimen fabrication App 20070145302 - Tomimatsu; Satoshi ; et al. | 2007-06-28 |
| Method and apparatus for specimen fabrication App 20070145299 - Tomimatsu; Satoshi ; et al. | 2007-06-28 |
| Method for failure analysis and system for failure analysis App 20070112533 - Tomimatsu; Satoshi ; et al. | 2007-05-17 |
| Method and apparatus for processing a micro sample Grant 7,205,560 - Tokuda , et al. April 17, 2 | 2007-04-17 |
| Method and apparatus for processing a micro sample Grant 7,205,554 - Tokuda , et al. April 17, 2 | 2007-04-17 |
| Method for failure analysis and system for failure analysis Grant 7,200,506 - Tomimatsu , et al. April 3, 2 | 2007-04-03 |
| Method and apparatus for specimen fabrication Grant 7,176,458 - Tomimatsu , et al. February 13, 2 | 2007-02-13 |
| Apparatus and method for specimen fabrication App 20060284112 - Tomimatsu; Satoshi ; et al. | 2006-12-21 |
| Ion beam apparatus and analysis method App 20060284115 - Kaneoka; Noriyuki ; et al. | 2006-12-21 |
| Method and apparatus for specimen fabrication Grant 7,138,628 - Tomimatsu , et al. November 21, 2 | 2006-11-21 |
| Method and apparatus for specimen fabrication App 20060231776 - Tomimatsu; Satoshi ; et al. | 2006-10-19 |
| Method and apparatus for specimen fabrication App 20060192099 - Tomimatsu; Satoshi ; et al. | 2006-08-31 |
| Method and apparatus for specimen fabrication Grant 7,071,475 - Tomimatsu , et al. July 4, 2 | 2006-07-04 |
| Ion beam system and machining method App 20060065854 - Shichi; Hiroyasu ; et al. | 2006-03-30 |
| Method of preventing charging, and apparatus for charged particle beam using the same App 20060060794 - Fukuda; Muneyuki ; et al. | 2006-03-23 |
| Method of prevention charging, and apparatus for charged particle beam using the same Grant 6,977,376 - Fukuda , et al. December 20, 2 | 2005-12-20 |
| Probe driving method, and probe apparatus App 20050269511 - Tomimatsu, Satoshi ; et al. | 2005-12-08 |
| Apparatus for inspecting defects of devices and method of inspecting defects Grant 6,970,004 - Ishitani , et al. November 29, 2 | 2005-11-29 |
| Probe driving method, and probe apparatus Grant 6,960,765 - Tomimatsu , et al. November 1, 2 | 2005-11-01 |
| Method and apparatus for processing a micro sample App 20050211927 - Tokuda, Mitsuo ; et al. | 2005-09-29 |
| Method and apparatus for processing a micro sample App 20050199828 - Tokuda, Mitsuo ; et al. | 2005-09-15 |
| Method and apparatus for processing a micro sample Grant 6,927,391 - Tokuda , et al. August 9, 2 | 2005-08-09 |
| Microfabrication apparatus and microfabrication method Grant 6,894,287 - Fukuda , et al. May 17, 2 | 2005-05-17 |
| Method and apparatus for specimen fabrication App 20050054029 - Tomimatsu, Satoshi ; et al. | 2005-03-10 |
| Apparatus for specimen fabrication and method for specimen fabrication Grant 6,858,851 - Tomimatsu , et al. February 22, 2 | 2005-02-22 |
| Method and apparatus for specimen fabrication App 20050006600 - Shichi, Hiroyasu ; et al. | 2005-01-13 |
| Method and apparatus for processing a micro sample App 20050001164 - Tokuda, Mitsuo ; et al. | 2005-01-06 |
| Method and apparatus for specimen fabrication Grant 6,828,566 - Tomimatsu , et al. December 7, 2 | 2004-12-07 |
| Method and apparatus for specimen fabrication Grant 6,794,663 - Shichi , et al. September 21, 2 | 2004-09-21 |
| Apparatus for inspecting defects of devices and method of inspecting defects App 20040178811 - Ishitani, Tohru ; et al. | 2004-09-16 |
| Method and apparatus for processing a micro sample Grant 6,781,125 - Tokuda , et al. August 24, 2 | 2004-08-24 |
| Method of preventing charging, and apparatus for charged particle beam using the same App 20040155185 - Fukuda, Muneyuki ; et al. | 2004-08-12 |
| Method of preventing charging, and apparatus for charged particle beam using the same Grant 6,774,363 - Fukuda , et al. August 10, 2 | 2004-08-10 |
| Microfabrication apparatus and microfabrication method App 20040135096 - Fukuda, Muneyuki ; et al. | 2004-07-15 |
| Apparatus for specimen fabrication and method for specimen fabrication App 20040129878 - Tomimatsu, Satoshi ; et al. | 2004-07-08 |
| Method and apparatus for specimen fabrication App 20040089821 - Shichi, Hiroyasu ; et al. | 2004-05-13 |
| Apparatus for detecting defect in device and method of detecting defect Grant 6,734,687 - Ishitani , et al. May 11, 2 | 2004-05-11 |
| Method for failure analysis and system for failure analysis App 20030236586 - Tomimatsu, Satoshi ; et al. | 2003-12-25 |
| Method and apparatus for specimen fabrication Grant 6,664,552 - Shichi , et al. December 16, 2 | 2003-12-16 |
| Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electron device App 20030198755 - Shichi, Hiroyasu ; et al. | 2003-10-23 |
| Method and apparatus for specimen fabrication App 20030183776 - Tomimatsu, Satoshi ; et al. | 2003-10-02 |
| Probe driving method, and probe apparatus App 20030184332 - Tomimatsu, Satoshi ; et al. | 2003-10-02 |
| Apparatus and method for observing sample using electron beam Grant 6,627,889 - Ochiai , et al. September 30, 2 | 2003-09-30 |
| Projection ion beam machining apparatus Grant 6,583,426 - Kawanami , et al. June 24, 2 | 2003-06-24 |
| Apparatus and method for observing sample using electron beam App 20030089852 - Ochiai, Isao ; et al. | 2003-05-15 |
| Method of preventing charging, and apparatus for charged particle beam using the same App 20030085354 - Fukuda, Muneyuki ; et al. | 2003-05-08 |
| Method and apparatus for specimen fabrication App 20020079463 - Shichi, Hiroyasu ; et al. | 2002-06-27 |
| Method and apparatus for processing a micro sample App 20020050565 - Tokuda, Mitsuo ; et al. | 2002-05-02 |
| Magnetic head having track width specified by grooves formed with projection ion beam Grant 5,910,871 - Kawanami , et al. June 8, 1 | 1999-06-08 |
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