Tokunaga; Chikako

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tokunaga; Chikako.The latest application filed is for "design method for scan test circuit, design program for scan test circuit and semiconductor integrated circuit".

Company Profile

1.21.24

Tokunaga; Chikako - Yokohama Kanagawa JP
Tokunaga; Chikako - Kanagawa-ken JP
Tokunaga; Chikako - Kanagawa JP
Tokunaga; Chikako - Yokohama N/A JP
Tokunaga; Chikako - Yokohama-shi JP
Tokunaga; Chikako - Kanagawa-Shi JP
Tokunaga; Chikako - Tokyo JP
Tokunaga; Chikako - Kawasaki JP
Tokunaga; Chikako - Kawasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Design Method For Scan Test Circuit, Design Program For Scan Test Circuit And Semiconductor Integrated Circuit App 20200096570 - Tokunaga; Chikako	2020-03-26
Semiconductor integrated circuit Grant 9,557,379 - Tokunaga , et al. January 31, 2	2017-01-31
Semiconductor integrated circuit with bist circuit Grant 9,443,611 - Tokunaga , et al. September 13, 2	2016-09-13
Semiconductor Integrated Circuit App 20160216331 - Tokunaga; Chikako ; et al.	2016-07-28
Semiconductor device Grant 9,159,456 - Anzou , et al. October 13, 2	2015-10-13
Semiconductor Device App 20150124537 - Anzou; Kenichi ; et al.	2015-05-07
Semiconductor Integrated Circuit with Bist Circuit App 20140245087 - TOKUNAGA; Chikako ; et al.	2014-08-28
Built-in self test circuit and designing apparatus Grant 8,671,317 - Anzou , et al. March 11, 2	2014-03-11
Semiconductor integrated circuit Grant 8,599,632 - Anzou , et al. December 3, 2	2013-12-03
Semiconductor Integrated Circuit App 20130070545 - Anzou; Kenichi ; et al.	2013-03-21
Built-in Self Test Circuit And Designing Apparatus App 20120246527 - Anzou; Kenichi ; et al.	2012-09-27
Semiconductor Integrated Circuit, Failure Diagnosis System And Failure Diagnosis Method App 20120229155 - Anzou; Kenichi ; et al.	2012-09-13
Semiconductor integrated circuit and method for controlling semiconductor integrated circuit Grant 8,201,037 - Anzou , et al. June 12, 2	2012-06-12
Semiconductor integrated circuit Grant 8,176,372 - Anzou , et al. May 8, 2	2012-05-08
Semiconductor integrated circuit Grant 8,134,880 - Anzou , et al. March 13, 2	2012-03-13
On-chip failure analysis circuit and on-chip failure analysis method Grant 8,037,376 - Anzou , et al. October 11, 2	2011-10-11
Semiconductor integrated circuit and test system thereof Grant 8,032,803 - Anzou , et al. October 4, 2	2011-10-04
Built-in self testing circuit with fault diagnostic capability Grant 7,962,821 - Tokunaga , et al. June 14, 2	2011-06-14
Semiconductor Integrated Circuit App 20110058434 - Anzou; Kenichi ; et al.	2011-03-10
Semiconductor Integrated Circuit, Circuit Function Veryfication Device And Method Of Veryfying Circuit Function App 20100251043 - Anzou; Kenichi ; et al.	2010-09-30
Semiconductor integrated circuit, design support software system, and automatic test pattern generation system Grant 7,797,591 - Hasegawa , et al. September 14, 2	2010-09-14
Integrated circuit device with built-in self test (BIST) circuit Grant 7,783,942 - Anzou , et al. August 24, 2	2010-08-24
Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereof Grant 7,734,975 - Anzou , et al. June 8, 2	2010-06-08
Semiconductor Integrated Circuit And Method For Controlling Semiconductor Integrated Circuit App 20100125766 - Anzou; Kenichi ; et al.	2010-05-20
Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memory Grant 7,653,854 - Anzou , et al. January 26, 2	2010-01-26
Semiconductor Integrated Circuit, Design Support Software System, And Automatic Test Pattern Generation System App 20090282285 - HASEGAWA; Tetsu ; et al.	2009-11-12
Semiconductor Integrated Circuit App 20090245000 - Anzou; Kenichi ; et al.	2009-10-01
Semiconductor integrated circuit, design support software system and automatic test pattern generation system Grant 7,577,885 - Hasegawa , et al. August 18, 2	2009-08-18
On-chip Failure Analysis Circuit And On-chip Failure Analysis Method App 20090172483 - Anzou; Kenichi ; et al.	2009-07-02
Semiconductor Integrated Circuit App 20090063917 - Tokunaga; Chikako ; et al.	2009-03-05
Semiconductor Integrated Circuit And Test System Thereof App 20090024885 - Anzou; Kenichi ; et al.	2009-01-22
Integrated Circuit Device App 20080112241 - Anzou; Kenichi ; et al.	2008-05-15
Semiconductor Integrated Circuit App 20080022176 - Anzou; Kenichi ; et al.	2008-01-24
Semiconductor Integrated Circuit And Design Apparatus Thereof App 20070226568 - Anzou; Kenichi ; et al.	2007-09-27
Semiconductor integrated circuit Grant 7,254,762 - Anzou , et al. August 7, 2	2007-08-07
Semiconductor integrated circuit verification system Grant 7,228,262 - Anzou , et al. June 5, 2	2007-06-05
Semiconductor integrated circuit, design support software system and automatic test pattern generation system App 20070079052 - Hasegawa; Tetsu ; et al.	2007-04-05
Semiconductor integrated circuit App 20070011535 - Anzou; Kenichi ; et al.	2007-01-11
Apparatus for delay fault testing of integrated circuits Grant 7,120,890 - Urata , et al. October 10, 2	2006-10-10
Semiconductor integrated circuit App 20050097418 - Anzou, Kenichi ; et al.	2005-05-05
Semiconductor integrated circuit verification system App 20050015693 - Anzou, Kenichi ; et al.	2005-01-20
Apparatus for generating test vector of semiconductor integrated circuit App 20050010886 - Urata, Koji ; et al.	2005-01-13