loadpatents
Patent applications and USPTO patent grants for Togashi; Takahiro.The latest application filed is for "electromagnetic wave transmission cable".
Patent | Date |
---|---|
Electromagnetic wave transmission cable including a hollow dielectric tube surrounded by a foamed resin member having different expansion ratios at different regions therein Grant 11,018,403 - Hosoda , et al. May 25, 2 | 2021-05-25 |
Electromagnetic Wave Transmission Cable App 20190296416 - HOSODA; Yasuo ;   et al. | 2019-09-26 |
Method for detecting particles and defects and inspection equipment thereof Grant RE44,977 - Togashi , et al. July 1, 2 | 2014-07-01 |
Method for detecting particles and defects and inspection equipment thereof Grant RE44,840 - Togashi , et al. April 15, 2 | 2014-04-15 |
Method of apparatus for detecting particles on a specimen Grant 8,289,507 - Hamamatsu , et al. October 16, 2 | 2012-10-16 |
Method for detecting particles and defects and inspection equipment thereof Grant 8,094,298 - Togashi , et al. January 10, 2 | 2012-01-10 |
Method Of Apparatus For Detecting Particles On A Specimen App 20110228258 - HAMAMATSU; Akira ;   et al. | 2011-09-22 |
Method of apparatus for detecting particles on a specimen Grant 7,952,700 - Hamamatsu , et al. May 31, 2 | 2011-05-31 |
Method Of Apparatus For Detecting Particles On A Specimen App 20110032515 - HAMAMATSU; Akira ;   et al. | 2011-02-10 |
Method of apparatus for detecting particles on a specimen Grant 7,817,261 - Hamamatsu , et al. October 19, 2 | 2010-10-19 |
Method For Detecting Particles And Defects And Inspection Equipment Thereof App 20100020315 - Togashi; Takahiro ;   et al. | 2010-01-28 |
Method for detecting particles and defects and inspection equipment thereof Grant 7,619,729 - Togashi , et al. November 17, 2 | 2009-11-17 |
Method For Detecting Particles And Defects And Inspection Equipment Thereof App 20090066941 - TOGASHI; Takahiro ;   et al. | 2009-03-12 |
Method for detecting particles and defects and inspection equipment thereof Grant 7,456,948 - Togashi , et al. November 25, 2 | 2008-11-25 |
Inspection device and inspection method of an object to be inspected App 20080218751 - Togashi; Takahiro ;   et al. | 2008-09-11 |
Method Of Apparatus For Detecting Particles On A Specimen App 20080204724 - Hamamatsu; Akira ;   et al. | 2008-08-28 |
Method of apparatus for detecting particles on a specimen Grant 7,369,223 - Hamamatsu , et al. May 6, 2 | 2008-05-06 |
Method for detecting particles and defects and inspection equipment thereof App 20080007725 - Togashi; Takahiro ;   et al. | 2008-01-10 |
Plasma display panel with offset discharge electrodes Grant 7,038,382 - Hashikawa , et al. May 2, 2 | 2006-05-02 |
Plasma display panel including partition wall member Grant 6,992,444 - Hashikawa , et al. January 31, 2 | 2006-01-31 |
Plasma display panel App 20060001376 - Ginno; Satoshi ;   et al. | 2006-01-05 |
Method of apparatus for detecting particles on a specimen App 20050213086 - Hamamatsu, Akira ;   et al. | 2005-09-29 |
Information read/write medium Grant 6,906,995 - Togashi , et al. June 14, 2 | 2005-06-14 |
Plasma display panel App 20040227464 - Hashikawa, Hirokazu ;   et al. | 2004-11-18 |
Plasma display panel App 20040222742 - Hashikawa, Hirokazu ;   et al. | 2004-11-11 |
Plasma display panel App 20040189199 - Komaki, Toshihiro ;   et al. | 2004-09-30 |
Phase-change type optical storage medium having multiple recording layers Grant 6,724,716 - Yamaguchi , et al. April 20, 2 | 2004-04-20 |
Information read/write medium App 20040001424 - Togashi, Takahiro ;   et al. | 2004-01-01 |
Method of making multi-layer optical recording medium App 20030235655 - Mitsuhata, Takanori ;   et al. | 2003-12-25 |
Information recording medium App 20020146875 - Yamaguchi, Masataka ;   et al. | 2002-10-10 |
Optical Pickup Device App 20010048063 - YANAGAWA, NAOHARU ;   et al. | 2001-12-06 |
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