Todokoro; Hideo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Todokoro; Hideo.The latest application filed is for "charged particle beam device".
Company Profile
2.109.74
- Todokoro; Hideo - Tokyo JP
- Todokoro; Hideo - Hinode N/A JP
- Todokoro; Hideo - Nishitama-gun JP
- Todokoro; Hideo - Hinode-cho JP
- Todokoro; Hideo - Nishitama JP
- Todokoro; Hideo - Hinode-machi JP
- Todokoro; Hideo - Hlnode JP
- Todokoro; Hideo - Hirode JP
- Todokoro; Hideo - Nishi-tama-gun JP
- Todokoro; Hideo - Hinodemachi JP
- Todokoro; Hideo - Hachioji JA
Patent Activity
| Patent | Date |
|---|---|
| Charged particle beam device Grant 10,903,037 - Kasuya , et al. January 26, 2 | 2021-01-26 |
| Charged Particle Beam Device App 20200090897 - KASUYA; Keigo ; et al. | 2020-03-19 |
| Sample electrification measurement method and charged particle beam apparatus Grant 8,835,844 - Ezumi , et al. September 16, 2 | 2014-09-16 |
| Charged particle beam apparatus, and method of controlling the same Grant 8,772,735 - Kasuya , et al. July 8, 2 | 2014-07-08 |
| Method and an apparatus of an inspection system using an electron beam Grant 8,604,430 - Iwabuchi , et al. December 10, 2 | 2013-12-10 |
| Charged Particle Beam Apparatus, And Method Of Controlling The Same App 20130063029 - KASUYA; Keigo ; et al. | 2013-03-14 |
| Charged particle beam apparatus, and method of controlling the same Grant 8,319,193 - Kasuya , et al. November 27, 2 | 2012-11-27 |
| Method And An Apparatus Of An Inspection System Using An Electron Beam App 20120132801 - IWABUCHI; Yuko ; et al. | 2012-05-31 |
| Method and apparatus of an inspection system using an electron beam Grant 8,134,125 - Iwabuchi , et al. March 13, 2 | 2012-03-13 |
| Apparatus and method for wafer pattern inspection Grant 7,982,188 - Shinada , et al. July 19, 2 | 2011-07-19 |
| Scanning electron microscope Grant 7,977,632 - Todokoro , et al. July 12, 2 | 2011-07-12 |
| Charged particle beam apparatus for forming a specimen image Grant 7,956,324 - Takahashi , et al. June 7, 2 | 2011-06-07 |
| Charged Particle Beam Apparatus, And Method Of Controlling The Same App 20110089336 - Kasuya; Keigo ; et al. | 2011-04-21 |
| Sample Electrification Measurement Method and Charged Particle Beam Apparatus App 20100294929 - Ezumi; Makoto ; et al. | 2010-11-25 |
| Monochromator and scanning electron microscope using the same Grant 7,838,827 - Ose , et al. November 23, 2 | 2010-11-23 |
| Electron beam apparatus with aberration corrector Grant 7,825,377 - Kawasaki , et al. November 2, 2 | 2010-11-02 |
| Image evaluation method and microscope Grant 7,805,023 - Ishitani , et al. September 28, 2 | 2010-09-28 |
| Method of forming a sample image and charged particle beam apparatus Grant 7,800,059 - Sato , et al. September 21, 2 | 2010-09-21 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,700,918 - Ezumi , et al. April 20, 2 | 2010-04-20 |
| Charge control apparatus and measurement apparatus equipped with the charge control apparatus Grant 7,683,319 - Makino , et al. March 23, 2 | 2010-03-23 |
| Charged particle beam apparatus Grant 7,642,514 - Takane , et al. January 5, 2 | 2010-01-05 |
| Charge control apparatus and measurement apparatus equipped with the charge control apparatus App 20090166557 - Makino; Hiroshi ; et al. | 2009-07-02 |
| Method And Apparatus Of An Inspection System Using An Electron Beam App 20090057556 - Iwabuchi; Yuko ; et al. | 2009-03-05 |
| Electron beam apparatus Grant 7,491,933 - Sato , et al. February 17, 2 | 2009-02-17 |
| Scanning Electron Microscope App 20090039259 - TODOKORO; Hideo ; et al. | 2009-02-12 |
| Electron beam apparatus with aberration corrector App 20090008551 - Kawasaki; Takeshi ; et al. | 2009-01-08 |
| Charged particle beam apparatus App 20080302962 - Takahashi; Noritsugu ; et al. | 2008-12-11 |
| Electron Microscope And Electron Beam Inspection System App 20080265161 - Murakoshi; Hisaya ; et al. | 2008-10-30 |
| Scanning electron microscope Grant 7,442,923 - Todokoro , et al. October 28, 2 | 2008-10-28 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,439,506 - Iwabuchi , et al. October 21, 2 | 2008-10-21 |
| Monochromator and scanning electron microscope using the same App 20080237463 - Ose; Yoichi ; et al. | 2008-10-02 |
| Method of forming a sample image and charged particle beam apparatus App 20080217535 - Sato; Mitsugu ; et al. | 2008-09-11 |
| Sample electrification measurement method and charged particle beam apparatus App 20080201091 - Ezumi; Makoto ; et al. | 2008-08-21 |
| Inspection system, inspection method, and process management method Grant 7,411,190 - Makino , et al. August 12, 2 | 2008-08-12 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 7,408,172 - Sato , et al. August 5, 2 | 2008-08-05 |
| Scanning electron microscope Grant 7,399,966 - Todokoro , et al. July 15, 2 | 2008-07-15 |
| Electron microscope and electron beam inspection system Grant 7,394,066 - Murakoshi , et al. July 1, 2 | 2008-07-01 |
| Method and scanning electron microscope for measuring width of material on sample Grant 7,385,196 - Shimoma , et al. June 10, 2 | 2008-06-10 |
| Charged particle beam apparatus App 20080116376 - Takane; Atsushi ; et al. | 2008-05-22 |
| Electron beam apparatus with aberration corrector Grant 7,375,323 - Kawasaki , et al. May 20, 2 | 2008-05-20 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,372,028 - Ezumi , et al. May 13, 2 | 2008-05-13 |
| Method of forming a sample image and charged particle beam apparatus Grant 7,361,894 - Sato , et al. April 22, 2 | 2008-04-22 |
| Image evaluation method and microscope Grant 7,340,111 - Ishitani , et al. March 4, 2 | 2008-03-04 |
| Charged Particle Beam Apparatus And Charged Particle Beam Irradiation Method App 20080042074 - SATO; MITSUGU ; et al. | 2008-02-21 |
| Charged particle beam apparatus Grant 7,329,868 - Takane , et al. February 12, 2 | 2008-02-12 |
| Monochromator and scanning electron microscope using the same Grant 7,315,024 - Ose , et al. January 1, 2 | 2008-01-01 |
| Image evaluation method and microscope App 20070280559 - Ishitani; Tohru ; et al. | 2007-12-06 |
| Scanning electron microscope Grant 7,294,835 - Todokoro , et al. November 13, 2 | 2007-11-13 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 7,282,722 - Sato , et al. October 16, 2 | 2007-10-16 |
| Scanning electron microscope App 20070221846 - Todokoro; Hideo ; et al. | 2007-09-27 |
| Method and an apparatus of an inspection system using an electron beam App 20070215803 - Iwabuchi; Yuko ; et al. | 2007-09-20 |
| Electron microscope and electron bean inspection system. App 20070181808 - Murakoshi; Hisaya ; et al. | 2007-08-09 |
| Image evaluation method and microscope Grant 7,236,651 - Ishitani , et al. June 26, 2 | 2007-06-26 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,232,996 - Iwabuchi , et al. June 19, 2 | 2007-06-19 |
| Electron beam apparatus with aberration corrector App 20070114409 - Kawasaki; Takeshi ; et al. | 2007-05-24 |
| Electron beam apparatus with aberration corrector Grant 7,199,365 - Kawasaki , et al. April 3, 2 | 2007-04-03 |
| Scanning charged-particle microscope Grant 7,186,975 - Ishitani , et al. March 6, 2 | 2007-03-06 |
| Method of forming a sample image and charged particle beam apparatus App 20070029478 - Sato; Mitsugu ; et al. | 2007-02-08 |
| Charged particle beam apparatus App 20070023657 - Takane; Atsushi ; et al. | 2007-02-01 |
| Method for determining depression/protrusion of sample and charged particle beam apparatus therefor Grant 7,166,840 - Takane , et al. January 23, 2 | 2007-01-23 |
| Method of forming a sample image and charged particle beam apparatus Grant 7,164,126 - Sato , et al. January 16, 2 | 2007-01-16 |
| Apparatus and method for wafer pattern inspection App 20060249676 - Shinada; Hiroyuki ; et al. | 2006-11-09 |
| Inspection system, inspection method, and process management method App 20060231758 - Makino; Hiroshi ; et al. | 2006-10-19 |
| Monochromator and scanning electron microscope using the same App 20060219910 - Ose; Yoichi ; et al. | 2006-10-05 |
| Sample electrification measurement method and charged particle beam apparatus App 20060219918 - Ezumi; Makoto ; et al. | 2006-10-05 |
| Charged particle beam apparatus Grant 7,109,485 - Takane , et al. September 19, 2 | 2006-09-19 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,087,899 - Ezumi , et al. August 8, 2 | 2006-08-08 |
| Method and an apparatus of an inspection system using an electron beam App 20060151699 - Iwabuchi; Yuko ; et al. | 2006-07-13 |
| Inspection system, inspection method, and process management method Grant 7,075,076 - Makino , et al. July 11, 2 | 2006-07-11 |
| Scanning electron microscope Grant 7,075,078 - Ose , et al. July 11, 2 | 2006-07-11 |
| Scanning electron microscope App 20060113474 - Todokoro; Hideo ; et al. | 2006-06-01 |
| Scanning electron microscope Grant 7,049,591 - Todokoro , et al. May 23, 2 | 2006-05-23 |
| Method of forming a sample image and charged particle beam apparatus Grant 7,034,296 - Sato , et al. April 25, 2 | 2006-04-25 |
| Scanning electron microscope App 20060071167 - Todokoro; Hideo ; et al. | 2006-04-06 |
| Apparatus and method for wafer pattern inspection Grant 7,022,986 - Shinada , et al. April 4, 2 | 2006-04-04 |
| Monochromator and scanning electron microscope using the same Grant 7,022,983 - Ose , et al. April 4, 2 | 2006-04-04 |
| Method and an apparatus of an inspection system using an electron beam Grant 7,012,252 - Iwabuchi , et al. March 14, 2 | 2006-03-14 |
| Electron beam apparatus with aberration corrector App 20060016991 - Kawasaki; Takeshi ; et al. | 2006-01-26 |
| Electron beam apparatus App 20060016992 - Sato; Mitsugu ; et al. | 2006-01-26 |
| Electron microscope and electron beam inspection system App 20060011835 - Murakoshi; Hisaya ; et al. | 2006-01-19 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,987,265 - Iwabuchi , et al. January 17, 2 | 2006-01-17 |
| Electron beam apparatus with aberration corrector Grant 6,982,427 - Kawasaki , et al. January 3, 2 | 2006-01-03 |
| Scanning electron microscope Grant 6,979,821 - Suzuki , et al. December 27, 2 | 2005-12-27 |
| Charged particle beam apparatus and charged particle beam irradiation method App 20050253083 - Sato, Mitsugu ; et al. | 2005-11-17 |
| Electron microscope observation system and observation method Grant 6,956,212 - Todokoro October 18, 2 | 2005-10-18 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 6,956,211 - Sato , et al. October 18, 2 | 2005-10-18 |
| Method and an apparatus of an inspection system using an electron beam App 20050205782 - Iwabuchi, Yuko ; et al. | 2005-09-22 |
| Sample electrification measurement method and charged particle beam apparatus Grant 6,946,656 - Ezumi , et al. September 20, 2 | 2005-09-20 |
| Image evaluation method and microscope App 20050199811 - Ishitani, Tohru ; et al. | 2005-09-15 |
| Charged particle beam apparatus Grant 6,936,818 - Takane , et al. August 30, 2 | 2005-08-30 |
| Charged particle beam apparatus App 20050184237 - Takane, Atsushi ; et al. | 2005-08-25 |
| Sample electrification measurement method and charged particle beam apparatus App 20050161600 - Ezumi, Makoto ; et al. | 2005-07-28 |
| Method for determining depression/protrusion of sample and charged particle beam apparatus therefor App 20050151078 - Takane, Atsushi ; et al. | 2005-07-14 |
| Scanning electron microscope App 20050139773 - Ose, Yoichi ; et al. | 2005-06-30 |
| Scanning electron microscope App 20050133719 - Todokoro, Hideo ; et al. | 2005-06-23 |
| Scanning electron microscope Grant 6,885,001 - Ose , et al. April 26, 2 | 2005-04-26 |
| Method for determining depression/protrusion of sample and charged particle beam apparatus therefor Grant 6,872,943 - Takane , et al. March 29, 2 | 2005-03-29 |
| Scanning electron microscope Grant 6,872,944 - Todokoro , et al. March 29, 2 | 2005-03-29 |
| Electron microscope observation system and observation method App 20050061975 - Todokoro, Hideo | 2005-03-24 |
| Inspection system, inspection method, and process management method App 20050051722 - Makino, Hiroshi ; et al. | 2005-03-10 |
| Electron beam apparatus Grant 6,864,482 - Sato , et al. March 8, 2 | 2005-03-08 |
| Scanning electron microscope Grant 6,847,038 - Todokoro , et al. January 25, 2 | 2005-01-25 |
| Method and scanning electron microscope for measuring width of material on sample App 20050006581 - Shimoma, Goroku ; et al. | 2005-01-13 |
| Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element Grant 6,839,200 - Takano , et al. January 4, 2 | 2005-01-04 |
| Electronic microscope observation system and observation method Grant 6,822,232 - Todokoro November 23, 2 | 2004-11-23 |
| Electron beam apparatus App 20040227081 - Sato, Mitsugu ; et al. | 2004-11-18 |
| Sample electrification measurement method and charged particle beam apparatus App 20040211899 - Ezumi, Makoto ; et al. | 2004-10-28 |
| Scanning electron microscope App 20040188612 - Ose, Yoichi ; et al. | 2004-09-30 |
| Monochromator and scanning electron microscope using the same App 20040188607 - Ose, Yoichi ; et al. | 2004-09-30 |
| Electron beam apparatus with aberration corrector App 20040188635 - Kawasaki, Takeshi ; et al. | 2004-09-30 |
| Method and scanning electron microscope for measuring dimension of material on sample Grant 6,791,084 - Shimoma , et al. September 14, 2 | 2004-09-14 |
| Scanning electron microscope Grant 6,787,772 - Ose , et al. September 7, 2 | 2004-09-07 |
| Charged particle beam apparatus and charged particle beam irradiation method App 20040119022 - Sato, Mitsugu ; et al. | 2004-06-24 |
| Scanning electron microscope App 20040113074 - Suzuki, Naomasa ; et al. | 2004-06-17 |
| Scanning electron microscope App 20040089805 - Todokoro, Hideo ; et al. | 2004-05-13 |
| Narrow track thin film magnetic head and fabrication method thereof App 20040080865 - Takano, Hisashi ; et al. | 2004-04-29 |
| Charged particle beam apparatus App 20040069956 - Takane, Atsushi ; et al. | 2004-04-15 |
| Scanning electron microscope App 20040051041 - Todokoro, Hideo ; et al. | 2004-03-18 |
| Scanning electron microscope App 20040036021 - Todokoro, Hideo ; et al. | 2004-02-26 |
| Scanning electron microscope Grant 6,667,476 - Todokoro , et al. December 23, 2 | 2003-12-23 |
| Magnetic head having track width defined by trench portions filled with magnetic shield material Grant 6,665,141 - Takano , et al. December 16, 2 | 2003-12-16 |
| Charged particle beam apparatus Grant 6,653,633 - Takane , et al. November 25, 2 | 2003-11-25 |
| Scanning electron microscope Grant 6,646,262 - Todokoro , et al. November 11, 2 | 2003-11-11 |
| Scanning electron microscope with voltage applied to the sample Grant 6,635,873 - Todokoro , et al. October 21, 2 | 2003-10-21 |
| Method of forming a sample image and charged particle beam apparatus App 20030141451 - Sato, Mitsugu ; et al. | 2003-07-31 |
| Charged particle beam apparatus App 20030136907 - Takane, Atsushi ; et al. | 2003-07-24 |
| Scanning Electron Microscope App 20030127604 - TODOKORO, HIDEO ; et al. | 2003-07-10 |
| Apparatus and method for wafer pattern inspection App 20030127593 - Shinada, Hiroyuki ; et al. | 2003-07-10 |
| Scanning electron microscope App 20030122074 - Suzuki, Naomasa ; et al. | 2003-07-03 |
| Method of forming a sample image and charged particle beam apparatus App 20030111602 - Sato, Mitsugu ; et al. | 2003-06-19 |
| Narrow track thin film magnetic head and fabrication method thereof App 20030099063 - Takano, Hisashi ; et al. | 2003-05-29 |
| Scanning electron microscope Grant 6,555,819 - Suzuki , et al. April 29, 2 | 2003-04-29 |
| Method and scanning electron microscope for measuring width of material on sample App 20030071214 - Shimoma, Goroku ; et al. | 2003-04-17 |
| Image-formation apparatus using charged particle beams under various focus conditions Grant 6,538,249 - Takane , et al. March 25, 2 | 2003-03-25 |
| Image evaluation method and microscope App 20030039386 - Ishitani, Tohru ; et al. | 2003-02-27 |
| Method and apparatus for inspecting patterns of a semiconductor device with an electron beam Grant 6,512,227 - Iwabuchi , et al. January 28, 2 | 2003-01-28 |
| Method for determining depression/protrusion of sample and charged particle beam apparatus therefor App 20030010914 - Takane, Atsushi ; et al. | 2003-01-16 |
| Scanning electron microscope App 20020148960 - Todokoro, Hideo ; et al. | 2002-10-17 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,452,178 - Iwabuchi , et al. September 17, 2 | 2002-09-17 |
| Method and an apparatus of an inspection system using an electron beam App 20020092986 - Iwabuchi, Yuko ; et al. | 2002-07-18 |
| Scanning charged-particle microscope App 20020079448 - Ishitani, Tohru ; et al. | 2002-06-27 |
| Narrow track thin film magnetic head and fabrication method thereof App 20020080521 - Takano, Hisashi ; et al. | 2002-06-27 |
| Method and apparatus for inspecting patterns of a semiconductor device with an electron beam App 20020024021 - Iwabuchi, Yuko ; et al. | 2002-02-28 |
| Method and an apparatus of an inspection system using an electron beam Grant 6,348,690 - Iwabuchi , et al. February 19, 2 | 2002-02-19 |
| Projecting type charged particle microscope and projecting type substrate inspection system Grant 6,310,341 - Todokoro , et al. October 30, 2 | 2001-10-30 |
| Method and an apparatus of an inspection system using an electron beam App 20010030294 - Iwabuchi, Yuko ; et al. | 2001-10-18 |
| Narrow track thin film head having a focused ion beam etched air bearing surface Grant 6,278,578 - Takano , et al. August 21, 2 | 2001-08-21 |
| Scanning electron microscope App 20010010357 - Ose, Yoichi ; et al. | 2001-08-02 |
| Scanning electron microscope and method for dimension measuring by using the same Grant 6,114,695 - Todokoro , et al. September 5, 2 | 2000-09-05 |
| Scanning electron microscope Grant 6,084,238 - Todokoro , et al. July 4, 2 | 2000-07-04 |
| Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2 | 2000-04-18 |
| Scanning electron microscope and method for dimension measuring by using the same Grant 5,969,357 - Todokoro , et al. October 19, 1 | 1999-10-19 |
| Scanning microscope Grant 5,929,439 - Todokoro , et al. July 27, 1 | 1999-07-27 |
| Scanning electron microscope Grant 5,900,629 - Todokoro , et al. May 4, 1 | 1999-05-04 |
| Method and apparatus for X-ray analyses Grant 5,877,498 - Sugimoto , et al. March 2, 1 | 1999-03-02 |
| Scanning electron microscope Grant 5,872,358 - Todokoro , et al. February 16, 1 | 1999-02-16 |
| Scanning electron microscope and method for dimension measuring by using the same Grant 5,866,904 - Todokoro , et al. February 2, 1 | 1999-02-02 |
| Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1 | 1999-02-02 |
| Electron beam apparatus Grant 5,598,002 - Todokoro , et al. January 28, 1 | 1997-01-28 |
| Scanning electron microscope and method for dimension measuring by using the same Grant 5,594,245 - Todokoro , et al. January 14, 1 | 1997-01-14 |
| Method and apparatus for x-ray analyses Grant 5,594,246 - Sudo , et al. January 14, 1 | 1997-01-14 |
| Surface analysis method and apparatus for carrying out the same Grant 5,481,109 - Ninomiya , et al. January 2, 1 | 1996-01-02 |
| Scanning electron microscope and method for controlling a scanning electron microscope Grant 5,424,541 - Todokoro , et al. June 13, 1 | 1995-06-13 |
| Electron beam apparatus Grant 5,412,209 - Otaka , et al. May 2, 1 | 1995-05-02 |
| Magnetic recording head capable of defining narrow track width and magnetic recording apparatus using the same Grant 5,402,295 - Suzuki , et al. March 28, 1 | 1995-03-28 |
| Electron beam writing system Grant 5,387,799 - Sohda , et al. February 7, 1 | 1995-02-07 |
| Instrument and method for 3-dimensional atomic arrangement observation Grant 5,278,408 - Kakibayashi , et al. January 11, 1 | 1994-01-11 |
| Scanning microscope and a method of operating such a scanning microscope Grant 5,276,325 - Todokoro , et al. January 4, 1 | 1994-01-04 |
| Method and apparatus of fabricating electric circuit pattern on thick and thin film hybrid multilayer wiring substrate Grant 5,162,240 - Saitou , et al. November 10, 1 | 1992-11-10 |
| Voltage measurement method using electron beam Grant 5,093,616 - Seitoh , et al. March 3, 1 | 1992-03-03 |
| Apparatus using charged particle beam Grant 4,827,127 - Todokoro May 2, 1 | 1989-05-02 |
| Electron beam metrology system Grant 4,751,384 - Murakoshi , et al. June 14, 1 | 1988-06-14 |
| Ion microbeam apparatus Grant 4,710,632 - Ishitani , et al. December 1, 1 | 1987-12-01 |
| Apparatus for chopping a charged particle beam Grant 4,626,690 - Todokoro , et al. December 2, 1 | 1986-12-02 |
| Potential analyzer Grant 4,554,455 - Todokoro , et al. November 19, 1 | 1985-11-19 |
| Field emission electron gun with anode heater and plural exhausts Grant 4,295,072 - Todokoro , et al. October 13, 1 | 1981-10-13 |
| Field emission electron gun Grant 4,274,035 - Fukuhara , et al. June 16, 1 | 1981-06-16 |
| Scanning transmission electron microscope Grant 4,099,055 - Todokoro July 4, 1 | 1978-07-04 |
| Stereoscopic measuring apparatus Grant 4,039,829 - Kato , et al. August 2, 1 | 1977-08-02 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 