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Data Processing Method, Edge Device, And Data Processing System
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Electronic Control Unit And Determination Method
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Distributed System
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Calculation System And Calculation Method
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Application logic, and verification method and configuration method thereof
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Electronic Control Device and Error Detection Method of Configuration Memory
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Vehicle Control Device And Electronic Control System
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Prediction Control Device And Method
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Semiconductor LSI design device and design method
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Electronic Control Device And Circuit Reconfiguration Method
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Semiconductor Lsi Design Device And Design Method
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Display device
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Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)
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Semiconductor LSI design device and design method
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Programmable device, error storage system, and electronic system device
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Soft Error Rate Calculation Device And Calculation Method For Semiconductor Large Scale Integration (lsi)
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Recognition Apparatus And Learning System
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Semiconductor device and multi-chip module
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Semiconductor LSI Design Device and Design Method
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Application Logic, And Verification Method And Configuration Method Thereof
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Semiconductor Device And Multi-chip Module
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Programmable logic device and logic integration tool
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Soft-error-rate calculating device
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Simulation apparatus and simulation method for determining soft error rates for a configured model
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Programmable Device, Error Storage System, and Electronic System Device
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Data processing device, semiconductor external view inspection device, and data volume increase alleviation method
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Programmable Logic Device and Logic Integration Tool
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Soft-Error-Rate Calculating Device
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Data Processing Device, Semiconductor External View Inspection Device, And Data Volume Increase Alleviation Method
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Measurement device and measurement method
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Programmable Device, Method For Reconfiguring Programmable Device, And Electronic Device
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Semiconductor Inspecting Apparatus
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Simulation Apparatus And Simulation Method
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Method and apparatus for inspecting defects of semiconductor device
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Measurement Device and Measurement Method
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Semiconductor Wafer Testing Apparatus
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Semiconductor inspecting apparatus
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Test Apparatus
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Method of diagnosing circuit board, circuit board, and CPU unit
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Semiconductor Inspecting Apparatus
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Apparatus Diagnosing Method, Apparatus Diagnosis Module, And Apparatus Mounted With Apparatus Diagnosis Module
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Method Of Diagnosing Circuit Board, Circuit Board, And Cpu Unit
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Method and apparatus for inspecting defects of semiconductor device
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Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory
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Semiconductor device, and the method of testing or making of the semiconductor device
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Defect analyzing device for semiconductor integrated circuits, system therefor, and detection method
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Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory
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Semiconductor device, and the method of testing or making of the semiconductor device
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