Tiwald; Thomas E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tiwald; Thomas E..The latest application filed is for "method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection".

Company Profile

0.23.6

Tiwald; Thomas E. - Lincoln NE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use Grant 10,073,120 - Hofmann , et al. September 11, 2	2018-09-11
Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use Grant 9,851,294 - Hofmann , et al. December 26, 2	2017-12-26
Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection Grant 9,599,569 - Tiwald , et al. March 21, 2	2017-03-21
Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection App 20160274032 - Tiwald; Thomas E. ; et al.	2016-09-22
Method to enhance sensitivity to surface-normal optical functions of anisotropic films using attenuated total reflection App 20140356520 - Tiwald; Thomas E. ; et al.	2014-12-04
Small volume cell Grant 8,531,665 - Pfeiffer , et al. September 10, 2	2013-09-10
Small volume cell Grant 8,493,565 - Pfeiffer , et al. July 23, 2	2013-07-23
Sample investigating system and method of use Grant 8,159,672 - Liphardt , et al. April 17, 2	2012-04-17
Small volume cell Grant 8,130,375 - Pfeiffer , et al. March 6, 2	2012-03-06
Small volume cell Grant 7,817,266 - Pfeiffer , et al. October 19, 2	2010-10-19
Ellipsometric investigation of anisotropic samples Grant 7,777,883 - Synowicki , et al. August 17, 2	2010-08-17
Back surface reflection reduction systems and methodology Grant 7,636,161 - Tiwald December 22, 2	2009-12-22
Sample investigating system Grant 7,623,237 - Liphardt , et al. November 24, 2	2009-11-24
Small volume cell App 20090027679 - Pfeiffer; Galen L. ; et al.	2009-01-29
Ellipsometric investigation of anisotropic samples App 20080266559 - Synowicki; Ronald ; et al.	2008-10-30
Sample analysis methodology utilizing electromagnetic radiation Grant 7,385,697 - Woollam , et al. June 10, 2	2008-06-10
System for reducing stress induced effects during determination of fluid optical constants Grant 7,349,092 - Tiwald , et al. March 25, 2	2008-03-25
Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface Grant 7,283,234 - Woollam , et al. October 16, 2	2007-10-16
Horizontal attenuated total reflection system Grant 7,265,839 - Tiwald September 4, 2	2007-09-04
Ellipsometric investigation of thin films Grant 7,193,709 - Johs , et al. March 20, 2	2007-03-20
Method of determining bulk refractive indicies of liquids from thin films thereof Grant 7,187,443 - Synowicki , et al. March 6, 2	2007-03-06
Method of applying parametric oscillators to model dielectric functions Grant 7,110,912 - Tiwald September 19, 2	2006-09-19
Sample analysis methodology utilizing electromagnetic radiation App 20040257567 - Woollam, John A. ; et al.	2004-12-23
Method for evaluating complex refractive indicies utilizing IR range ellipsometry Grant 6,801,312 - Tiwald October 5, 2	2004-10-05
Method of determining bulk refractive indicies of fluids from thin films thereof Grant 6,738,139 - Synowicki , et al. May 18, 2	2004-05-18
Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces Grant 6,455,853 - Herzinger , et al. September 24, 2	2002-09-24
Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces App 20010042832 - Herzinger, Craig M. ; et al.	2001-11-22

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