Tingay; John

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tingay; John.The latest application filed is for "x-ray inspection apparatus".

Company Profile

2.6.6

Tingay; John - Cambridge GB
Tingay; John - Cottenham GB

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
X-ray inspection apparatus Grant 10,393,675 - Tingay , et al. A	2019-08-27
X-ray inspection apparatus for inspecting semiconductor wafers Grant 10,215,716 - Tingay , et al. Feb	2019-02-26
X-ray Inspection Apparatus App 20170025317 - TINGAY; John ; et al.	2017-01-26
X-ray Inspection Apparatus For Inspecting Semiconductor Wafers App 20170011973 - Tingay; John ; et al.	2017-01-12
Method and apparatus for generating a three-dimensional model of a region of interest using an imaging system Grant 9,442,080 - Golubovic , et al. September 13, 2	2016-09-13
Method And Apparatus For Generating A Three-dimensional Model Of A Region Of Interest Using An Imaging System App 20150369757 - Golubovic; Dragos ; et al.	2015-12-24
Method and apparatus for generating a three-dimensional model of a region of interest using an imaging system Grant 9,129,427 - Golubovic , et al. September 8, 2	2015-09-08
Method And Apparatus For Generating A Three-dimensional Model Of A Region Of Interest Using An Imaging System App 20130108017 - Golubovic; Dragos ; et al.	2013-05-02
Substrate loading and unloading apparatus Grant 7,783,377 - Harris , et al. August 24, 2	2010-08-24
Device for influencing an electron beam Grant 6,885,009 - Tingay , et al. April 26, 2	2005-04-26
Substrate loading and unloading apparatus App 20040037676 - Harris, Paul ; et al.	2004-02-26
Device for influencing an electron beam App 20030230727 - Tingay, John ; et al.	2003-12-18

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