Ting; Tso-Hui

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ting; Tso-Hui.The latest application filed is for "pressure sensing and control for semiconductor wafer probing".

Company Profile

0.22.19

Ting; Tso-Hui - Stormville NY
Ting; Tso-Hui - Hopewell Junction NY US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
LCR test circuit structure for detecting metal gate defect conditions Grant 9,780,007 - Ouyang , et al. October 3, 2	2017-10-03
Semiconductor wafer probing system including pressure sensing and control unit Grant 9,702,930 - Edwards , et al. July 11, 2	2017-07-11
Configurable interposer Grant 9,524,930 - Gluschenkov , et al. December 20, 2	2016-12-20
Pressure Sensing And Control For Semiconductor Wafer Probing App 20160216321 - Edwards; Robert D. ; et al.	2016-07-28
Pressure sensing and control for semiconductor wafer probing Grant 9,354,252 - Edwards , et al. May 31, 2	2016-05-31
Yield enhancement for stacked chips through rotationally-connecting-interposer Grant 9,151,781 - Gluschenkov , et al. October 6, 2	2015-10-06
Pressure Sensing And Control For Semiconductor Wafer Probing App 20150145544 - Edwards; Robert D. ; et al.	2015-05-28
Pressure sensing and control for semiconductor wafer probing Grant 8,963,567 - Edwards , et al. February 24, 2	2015-02-24
Configurable interposer Grant 8,759,152 - Gluschenkov , et al. June 24, 2	2014-06-24
Noncontact electrical testing with optical techniques Grant 8,742,782 - Ouyang , et al. June 3, 2	2014-06-03
Configurable Interposer App 20140145351 - Gluschenkov; Oleg ; et al.	2014-05-29
Wafer alignment system with optical coherence tomography Grant 8,489,225 - Xin , et al. July 16, 2	2013-07-16
Lcr Test Circuit Structure For Detecting Metal Gate Defect Conditions App 20130169308 - Ouyang; Xu ; et al.	2013-07-04
Pressure Sensing And Control For Semiconductor Wafer Probing App 20130106455 - Edwards; Robert D. ; et al.	2013-05-02
Security control of analysis results Grant 8,429,193 - Song , et al. April 23, 2	2013-04-23
Noncontact Electrical Testing With Optical Techniques App 20130027051 - Ouyang; Xu ; et al.	2013-01-31
In-line characterization of a device under test Grant 8,299,809 - Ting , et al. October 30, 2	2012-10-30
Configurable Interposer App 20120241977 - Gluschenkov; Oleg ; et al.	2012-09-27
Wafer Alignment System With Optical Coherence Tomography App 20120232686 - Xin; Yongchun ; et al.	2012-09-13
Configurable interposer Grant 8,237,278 - Gluschenkov , et al. August 7, 2	2012-08-07
Yield Enhancement For Stacked Chips Through Rotationally-connecting-interposer App 20120146682 - Gluschenkov; Oleg ; et al.	2012-06-14
Yield enhancement for stacked chips through rotationally-connecting-interposer Grant 8,159,247 - Gluschenkov , et al. April 17, 2	2012-04-17
Configurable Interposer App 20110115082 - Gluschenkov; Oleg ; et al.	2011-05-19
Yield Enhancement For Stacked Chips Through Rotationally-connecting-interposer App 20110080189 - Gluschenkov; Oleg ; et al.	2011-04-07
In-line Characterization App 20110068813 - Ting; Tso-Hui ; et al.	2011-03-24
Method of establishing a lot grade system for product lots in a semiconductor manufacturing process Grant 7,908,023 - Crawford , et al. March 15, 2	2011-03-15
Real time system for monitoring the commonality, sensitivity, and repeatability of test probes Grant 7,856,332 - Karthikeyan , et al. December 21, 2	2010-12-21
Security Control Of Analysis Results App 20100185675 - Song; Yunsheng ; et al.	2010-07-22
Method Of Establishing A Lot Grade System For Product Lots In A Semiconductor Manufacturing Process App 20090182447 - Crawford; Edward J. ; et al.	2009-07-16
Real Time System For Monitoring The Commonality, Sensitivity, And Repeatability Of Test Probes App 20090143999 - Karthikeyan; Muthukumarasamy ; et al.	2009-06-04
Automated Yield Split Lot (ewr) And Process Change Notification (pcn) Analysis System App 20090125829 - DALTON; ANDREW S. ; et al.	2009-05-14

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