TIMONEY; PADRAIG
Patent Applications and Registrations
Patent applications and USPTO patent grants for TIMONEY; PADRAIG.The latest application filed is for "process control of semiconductor fabrication based on linkage between different fabrication steps".
- TIMONEY; PADRAIG - CLIFTON PARK NY
- Timoney; Padraig - Malta NY
| Patent | Date |
|---|---|
| Process Control Of Semiconductor Fabrication Based On Linkage Between Different Fabrication Steps App 20200279783 - TIMONEY; PADRAIG ; et al. | 2020-09-03 |
| Three-dimensional scatterometry for measuring dielectric thickness Grant 10,508,900 - Timoney , et al. Dec | 2019-12-17 |
| Three-dimensional Scatterometry For Measuring Dielectric Thickness App 20180135967 - TIMONEY; Padraig ; et al. | 2018-05-17 |
| Three-dimensional scatterometry for measuring dielectric thickness Grant 9,903,707 - Timoney , et al. February 27, 2 | 2018-02-27 |
| Three-dimensional Scatterometry For Measuring Dielectric Thickness App 20170082423 - TIMONEY; Padraig ; et al. | 2017-03-23 |
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