TIMBRE TECHNOLOGIES, INC.

Patent Applications and Registrations

Patent applications and USPTO patent grants for TIMBRE TECHNOLOGIES, INC..The latest application filed is for "radiation detector including field effect transistor in resonant cavity nanostructure".

Company Profile

1.71.44

TIMBRE TECHNOLOGIES, INC. - Washington DC US
Timbre Technologies, Inc. - Santa Clara CA
Timbre Technologies, Inc. - 2953 Bunker Lane, Suite 301 Santa Clara CA
TIMBRE TECHNOLOGIES, INC. -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Radiation Detector Including Field Effect Transistor In Resonant Cavity Nanostructure App 20220042853 - Assadi; Saeed ; et al.	2022-02-10
Radiation detector including field effect transistor in resonant cavity nanostructure Grant 11,209,318 - Assadi , et al. December 28, 2	2021-12-28
Radiation Detector Including Field Effect Transistor In Resonant Cavity Nanostructure App 20190383667 - Assadi; Saeed ; et al.	2019-12-19
Optical Metrology Of Structures Formed On Semiconductor Wafers Using Machine Learning Systems App 20090198635 - Doddi; Srinivas ; et al.	2009-08-06
Transforming Metrology Data From A Semiconductor Treatment System Using Multivariate Analysis App 20090094001 - VUONG; Vi ; et al.	2009-04-09
Modeling and measuring structures with spatially varying properties in optical metrology Grant 7,515,282 - Li , et al. April 7, 2	2009-04-07
Model and parameter selection for optical metrology Grant 7,505,153 - Vuong , et al. March 17, 2	2009-03-17
Selection of wavelengths for integrated circuit optical metrology Grant 7,474,993 - Doddi , et al. January 6, 2	2009-01-06
In-die optical metrology Grant 7,474,420 - Li , et al. January 6, 2	2009-01-06
Transforming metrology data from a semiconductor treatment system using multivariate analysis Grant 7,467,064 - Vuong , et al. December 16, 2	2008-12-16
Optical Metrology Optimization For Repetitive Structures App 20080285054 - VUONG; Vi ; et al.	2008-11-20
Examining a structure formed on a semiconductor wafer using machine learning systems Grant 7,453,584 - Li , et al. November 18, 2	2008-11-18
Generic interface for an optical metrology system Grant 7,450,232 - Li , et al. November 11, 2	2008-11-11
Optimized characterization of wafers structures for optical metrology Grant 7,444,196 - Scheer , et al. October 28, 2	2008-10-28
Optical Metrology Of Single Features App 20080259357 - BISCHOFF; Joerg ; et al.	2008-10-23
Adaptive correlation of pattern resist structures using optical metrology Grant 7,440,881 - Engelhard , et al. October 21, 2	2008-10-21
Generation Of A Library Of Periodic Grating Diffraction Signals App 20080249754 - Niu; Xinhui ; et al.	2008-10-09
Optimization of diffraction order selection for two-dimensional structures Grant 7,428,060 - Jin , et al. September 23, 2	2008-09-23
Generating simulated diffraction signals for two-dimensional structures Grant 7,427,521 - Bischoff , et al. September 23, 2	2008-09-23
Split machine learning systems Grant 7,421,414 - Liu , et al. September 2, 2	2008-09-02
Azimuthal scanning of a structure formed on a semiconductor wafer Grant 7,414,733 - Bischoff , et al. August 19, 2	2008-08-19
Optical Metrology Model Optimization For Repetitive Structures App 20080195342 - LI; Shifang ; et al.	2008-08-14
Optical metrology model optimization for process control Grant 7,395,132 - Prager , et al. July 1, 2	2008-07-01
Selecting a hypothetical profile to use in optical metrology Grant 7,394,554 - Vuong , et al. July 1, 2	2008-07-01
Model And Parameter Selection For Optical Metrology App 20080151269 - Vuong; Vi ; et al.	2008-06-26
Optical metrology optimization for repetitive structures Grant 7,388,677 - Vuong , et al. June 17, 2	2008-06-17
Optical metrology of single features Grant 7,379,192 - Bischoff , et al. May 27, 2	2008-05-27
Optical metrology model optimization for repetitive structures Grant 7,355,728 - Li , et al. April 8, 2	2008-04-08
Library Accuracy Enhancment And Evaluation App 20080071504 - Li; Shifang ; et al.	2008-03-20
Model and parameter selection for optical metrology Grant 7,330,279 - Vuong , et al. February 12, 2	2008-02-12
Examining A Structure Formed On A Semiconductor Wafer Using Machine Learning Systems App 20080033683 - LI; Shifang ; et al.	2008-02-07
Library accuracy enhancement and evaluation Grant 7,302,367 - Li , et al. November 27, 2	2007-11-27
Optimized characterization of wafers structures for optical metrology App 20070250200 - Scheer; Steven ; et al.	2007-10-25
Azimuthal scanning of a structure formed on a semiconductor wafer App 20070236705 - Bischoff; Joerg ; et al.	2007-10-11
Examining a structure formed on a semiconductor wafer using machine learning systems Grant 7,280,229 - Li , et al. October 9, 2	2007-10-09
Optical metrology of multiple patterned layers App 20070229854 - Wu; Li ; et al.	2007-10-04
In-die optical metrology App 20070229855 - Li; Shifang ; et al.	2007-10-04
Generation of a library of periodic grating diffraction signals Grant 7,277,189 - Niu , et al. October 2, 2	2007-10-02
Optical metrology model optimization for process control App 20070225851 - Prager; Dan ; et al.	2007-09-27
Library accuracy enhancement and evaluation App 20070225940 - Li; Shifang ; et al.	2007-09-27
Optimization of diffraction order selection for two-dimensional structures App 20070223011 - Jin; Wen ; et al.	2007-09-27
Resolution enhanced optical metrology Grant 7,274,472 - Bischoff September 25, 2	2007-09-25
Optical metrology of a structure formed on a semiconductor wafer using optical pulses Grant 7,274,465 - Bischoff , et al. September 25, 2	2007-09-25
Generic interface for an optical metrology system Grant 7,271,902 - Li , et al. September 18, 2	2007-09-18
Weighting function to enhance measured diffraction signals in optical metrology App 20070211260 - Vuong; Vi ; et al.	2007-09-13
Selection of wavelengths for integrated circuit optical metrology App 20070198211 - Doddi; Srinivas ; et al.	2007-08-23
Transforming metrology data from a semiconductor treatment system using multivariate analysis App 20070185684 - Vuong; Vi ; et al.	2007-08-09
Optical metrology model optimization based on goals App 20070135959 - Vuong; Vi ; et al.	2007-06-14
Azimuthal scanning of a structure formed on a semiconductor wafer Grant 7,224,471 - Bischoff , et al. May 29, 2	2007-05-29
Selection of wavelengths for integrated circuit optical metrology Grant 7,216,045 - Doddi , et al. May 8, 2	2007-05-08
Optical metrology model optimization based on goals Grant 7,171,284 - Vuong , et al. January 30, 2	2007-01-30
Modeling and measuring structures with spatially varying properties in optical metrology App 20070002337 - Li; Shifang ; et al.	2007-01-04
Optical metrology model optimization for repetitive structures App 20060290947 - Li; Shifang ; et al.	2006-12-28
Generation and use of integrated circuit profile-based simulation information Grant 7,136,796 - Jakatdar , et al. November 14, 2	2006-11-14
Parametric optimization of optical metrology model Grant 7,126,700 - Bao , et al. October 24, 2	2006-10-24
Split machine learning systems App 20060224528 - Liu; Wei ; et al.	2006-10-05
Selecting unit cell configuration for repeating structures in optical metrology App 20060187466 - Li; Shifang ; et al.	2006-08-24
Optical metrology of single features App 20060187468 - Bischoff; Joerg ; et al.	2006-08-24
Optical metrology of a structure formed on a semiconductor wafer using optical pulses App 20060181713 - Bischoff; Joerg ; et al.	2006-08-17
Optimized model and parameter selection for optical metrology Grant 7,092,110 - Balasubramanian , et al. August 15, 2	2006-08-15
Model optimization for structures with additional materials Grant 7,072,049 - Niu , et al. July 4, 2	2006-07-04
Generic interface for an optical metrology system Grant 7,064,829 - Li , et al. June 20, 2	2006-06-20
Optical metrology model optimization for process control Grant 7,065,423 - Prager , et al. June 20, 2	2006-06-20
Examining a structure formed on a semiconductor wafer using machine learning systems App 20060119863 - Li; Shifang ; et al.	2006-06-08
Edge roughness measurement in optical metrology Grant 7,046,375 - Bischoff , et al. May 16, 2	2006-05-16
Balancing planarization of layers and the effect of underlying structure on the metrology signal Grant 7,041,515 - Jakatdar , et al. May 9, 2	2006-05-09
Optical metrology of single features Grant 7,030,999 - Bischoff , et al. April 18, 2	2006-04-18
Generating a library of simulated-diffraction signals and hypothetical profiles of periodic gratings Grant 7,031,894 - Niu , et al. April 18, 2	2006-04-18
Optical metrology model optimization based on goals App 20060064280 - Vuong; Vi ; et al.	2006-03-23
Controlling critical dimensions of structures formed on a wafer in semiconductor processing App 20060046166 - Yang; Wenge ; et al.	2006-03-02
Optical metrology model optimization for process control App 20060009872 - Prager; Dan ; et al.	2006-01-12
Shape roughness measurement in optical metrology App 20050275850 - Bischoff, Joerg ; et al.	2005-12-15
Generation of a library of periodic grating diffraction signals App 20050256687 - Niu, Xinhui ; et al.	2005-11-17
Method and system of dynamic learning through a regression-based library generation process Grant 6,961,679 - Niu , et al. November 1, 2	2005-11-01
Caching of intra-layer calculations for rapid rigorous coupled-wave analyses Grant 6,952,271 - Niu , et al. October 4, 2	2005-10-04
Optical metrology optimization for repetitive structures App 20050209816 - Vuong, Vi ; et al.	2005-09-22
Overlay measurements using zero-order cross polarization measurements Grant 6,947,141 - Bischoff , et al. September 20, 2	2005-09-20
Generation of a library of periodic grating diffraction signals Grant 6,943,900 - Niu , et al. September 13, 2	2005-09-13
Selecting a profile model for use in optical metrology using a machine learining system App 20050192914 - Drege, Emmanuel ; et al.	2005-09-01
Method and system for dynamic learning through a regression-based library generation process Grant 6,928,395 - Niu , et al. August 9, 2	2005-08-09
Caching of intra-layer calculations for rapid rigorous coupled-wave analyses Grant 6,891,626 - Niu , et al. May 10, 2	2005-05-10
Azimuthal scanning of a structure formed on a semiconductor wafer App 20050088665 - Bischoff, Joerg ; et al.	2005-04-28
Grating test patterns and methods for overlay metrology Grant 6,855,464 - Niu , et al. February 15, 2	2005-02-15
Clustering for data compression Grant 6,857,114 - Doddi February 15, 2	2005-02-15
Overlay measurements using zero-order cross polarization measurements App 20050030536 - Bischoff, Joerg ; et al.	2005-02-10
Metrology hardware adaptation with universal library Grant 6,853,942 - Drege , et al. February 8, 2	2005-02-08
Adaptive correlation of pattern resist structures using optical metrology App 20050007577 - Engelhard, Daniel Edward ; et al.	2005-01-13
Integrated circuit profile value determination Grant 6,842,261 - Bao , et al. January 11, 2	2005-01-11
Optical profilometry of additional-material deviations in a periodic grating Grant 6,839,145 - Niu , et al. January 4, 2	2005-01-04
System and method for efficient simulation of reflectometry response from two-dimensional grating structures Grant 6,833,914 - Bao , et al. December 21, 2	2004-12-21
Method and system of dynamic learning through a regression-based library generation process App 20040225477 - Niu, Xinhui ; et al.	2004-11-11
Method and system of dynamic learning through a regression-based library generation process App 20040220760 - Niu, Xinhui ; et al.	2004-11-04
Optical metrology of single features App 20040212812 - Bischoff, Joerg ; et al.	2004-10-28
Overlay measurements using zero-order cross polarization measurements Grant 6,804,005 - Bischoff , et al. October 12, 2	2004-10-12
Adaptive correlation of pattern resist structures using optical metrology Grant 6,791,679 - Engelhard , et al. September 14, 2	2004-09-14
Metrology diffraction signal adaptation for tool-to-tool matching Grant 6,792,328 - Laughery , et al. September 14, 2	2004-09-14
Method and system of dynamic learning through a regression-based library generation process Grant 6,785,638 - Niu , et al. August 31, 2	2004-08-31
Single pass lithography overlay technique Grant 6,780,550 - Laughery , et al. August 24, 2	2004-08-24
Optical metrology of single features Grant 6,775,015 - Bischoff , et al. August 10, 2	2004-08-10
Overlay measurements using periodic gratings Grant 6,772,084 - Bischoff , et al. August 3, 2	2004-08-03
Balancing planarization of layers and the effect of underlying structure on the metrology signal App 20040147048 - Jakatdar, Nickhil ; et al.	2004-07-29
System and method for real-time library generation of grating profiles Grant 6,768,983 - Jakatdar , et al. July 27, 2	2004-07-27
System and method for characterizing macro-grating test patterns in advanced lithography and etch processes Grant 6,750,961 - Niu , et al. June 15, 2	2004-06-15
Balancing planarization of layers and the effect of underlying structure on the metrology signal Grant 6,743,646 - Jakatdar , et al. June 1, 2	2004-06-01
Metrology hardware specification using a hardware simulator Grant 6,721,691 - Bao , et al. April 13, 2	2004-04-13
Grating test patterns and methods for overlay metrology Grant 6,699,624 - Niu , et al. March 2, 2	2004-03-02
Profiler business model Grant 6,694,275 - Jakadar , et al. February 17, 2	2004-02-17
Combined optical profilometry and projection microscopy of integrated circuit structures Grant 6,645,824 - Yang , et al. November 11, 2	2003-11-11
System and method for grating profile classification Grant 6,636,843 - Doddi , et al. October 21, 2	2003-10-21
Measurement of metal electroplating and seed layer thickness and profile Grant 6,608,686 - Lane , et al. August 19, 2	2003-08-19
Optical profilometry of additional-material deviations in a periodic grating Grant 6,608,690 - Niu , et al. August 19, 2	2003-08-19
Profile refinement for integrated circuit metrology Grant 6,609,086 - Bao , et al. August 19, 2	2003-08-19
System and method for characterizing macro-grating test patterns in advanced lithography and etch processes Grant 6,538,731 - Niu , et al. March 25, 2	2003-03-25
System and method for grating profile classification App 20020188580 - Doddi, Srinivas ; et al.	2002-12-12

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