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Patent applications and USPTO patent grants for Tiffin; Donald A..The latest application filed is for "apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident x-ray photons".
Patent | Date |
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Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons Grant 6,005,915 - Hossain , et al. December 21, 1 | 1999-12-21 |
Apparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor wafer Grant 5,754,620 - Hossain , et al. May 19, 1 | 1998-05-19 |
Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer Grant 5,742,658 - Tiffin , et al. April 21, 1 | 1998-04-21 |
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