Tiemeyer; Timothy R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tiemeyer; Timothy R..The latest application filed is for "system with multiple scattered light collectors".

Company Profile

0.6.7

Tiemeyer; Timothy R. - Providence RI
Tiemeyer; Timothy R. - Randolph MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System with multiple scattered light collectors Grant 9,103,800 - Bills , et al. August 11, 2	2015-08-11
System With Multiple Scattered Light Collectors App 20130335733 - Bills; Richard E. ; et al.	2013-12-19
System and method for inspection of a workpiece surface using multiple scattered light collectors Grant 8,497,984 - Bills , et al. July 30, 2	2013-07-30
System and method for signal processing for a workpiece surface inspection system Grant 7,505,125 - Andrews , et al. March 17, 2	2009-03-17
System and method for inspecting a workpiece surface using surface structure spatial frequencies Grant 7,286,218 - Tiemeyer , et al. October 23, 2	2007-10-23
Detection of a wafer edge using collimated light Grant 7,280,200 - Plemmons , et al. October 9, 2	2007-10-09
System and method for inspection of a workpiece surface using multiple scattered light collectors App 20060256326 - Bills; Richard Earl ; et al.	2006-11-16
System and method for inspecting a workpiece surface using combinations of light collectors App 20060192950 - Judell; Neil ; et al.	2006-08-31
System and method for signal processing for a workpiece surface inspection system App 20060181700 - Andrews; Scott ; et al.	2006-08-17
Detection of a wafer edge using collimated light App 20050024632 - Plemmons, Mark P. ; et al.	2005-02-03
Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data App 20040258295 - Tiemeyer, Timothy R. ; et al.	2004-12-23
Method and system for analyzing and tracking defects among a plurality of substrates such as silicon wafers App 20040252879 - Tiemeyer, Timothy R. ; et al.	2004-12-16

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