Thys; Frank
Patent Applications and Registrations
Patent applications and USPTO patent grants for Thys; Frank.The latest application filed is for "measurement probe unit for metrology applications".
- Thys; Frank - Willebroek BE
| Patent | Date |
|---|---|
| Measurement probe unit for metrology applications Grant 10,267,629 - Thys , et al. | 2019-04-23 |
| Measurement Probe Unit For Metrology Applications App 20180172442 - Thys; Frank | 2018-06-21 |
| Optical scanning probe Grant 9,696,146 - Blanckaert , et al. July 4, 2 | 2017-07-04 |
| Optical Scanning Probe App 20150043008 - Blanckaert; Patrick ; et al. | 2015-02-12 |
| Optical probe for scanning the features of an object and methods thereof Grant 7,428,061 - Coppenolle , et al. September 23, 2 | 2008-09-23 |
| Optical probe for scanning the features of an object and methods thereof App 20060215176 - Van Coppenolle; Bart ; et al. | 2006-09-28 |
| Optical probe for scanning the features of an object and methods therefor Grant 7,009,717 - Van Coppenolle , et al. March 7, 2 | 2006-03-07 |
| Optical probe for scanning the features of an object and methods therefor App 20040130729 - Van Coppenolle, Bart ; et al. | 2004-07-08 |
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