loadpatents
Patent applications and USPTO patent grants for Thornell; John.The latest application filed is for "inspection of substrates".
Patent | Date |
---|---|
Inspection of substrates Grant 10,553,504 - Singh , et al. Fe | 2020-02-04 |
Semiconductor device inspection of metallic discontinuities Grant 10,466,179 - Singh , et al. No | 2019-11-05 |
Semiconductor Device Inspection Of Metallic Discontinuities App 20180275063 - Singh; Gurvinder ;   et al. | 2018-09-27 |
Inspection Of Substrates App 20180277452 - Singh; Gurvinder ;   et al. | 2018-09-27 |
System and method of characterizing micro-fabrication processes Grant 10,024,804 - Thornell , et al. July 17, 2 | 2018-07-17 |
System And Method Of Characterizing Micro-fabrication Processes App 20170254757 - Thornell; John ;   et al. | 2017-09-07 |
System and method of characterizing micro-fabrication processes Grant 9,658,169 - Thornell , et al. May 23, 2 | 2017-05-23 |
System And Method Of Characterizing Micro-fabrication Processes App 20150316487 - Thornell; John ;   et al. | 2015-11-05 |
System And Method Of Characterizing Micro-fabrication Processes App 20140320635 - Thornell; John ;   et al. | 2014-10-30 |
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