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Patent applications and USPTO patent grants for Thiessen; William F..The latest application filed is for "probe pin cleaning system and method".
Patent | Date |
---|---|
Probe pin cleaning system Grant 7,392,563 - Fulton , et al. July 1, 2 | 2008-07-01 |
Temperature compensated vertical pin probing device Grant 6,927,586 - Thiessen August 9, 2 | 2005-08-09 |
Probe pin cleaning system and method App 20040134516 - Fulton, William H. ;   et al. | 2004-07-15 |
Temperature compensated vertical pin probing device App 20040051546 - Thiessen, William F. | 2004-03-18 |
Nickel alloy probe card frame laminate Grant 6,661,244 - McQuade , et al. December 9, 2 | 2003-12-09 |
Nickel alloy probe card frame laminate App 20030146769 - McQuade, Francis T. ;   et al. | 2003-08-07 |
Temperature compensated vertical pin probing device Grant 6,297,657 - Thiessen , et al. October 2, 2 | 2001-10-02 |
Temperature compensated vertical pin probing device Grant 6,163,162 - Thiessen , et al. December 19, 2 | 2000-12-19 |
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