loadpatents
name:-0.0098540782928467
name:-0.008897066116333
name:-0.00050020217895508
TEZUKA; Yoshihiro Patent Filings

TEZUKA; Yoshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for TEZUKA; Yoshihiro.The latest application filed is for "measurement tool and method for lithography masks".

Company Profile
0.7.8
  • TEZUKA; Yoshihiro - Tsukuba-shi JP
  • Tezuka; Yoshihiro - Tsukuba JP
  • Tezuka; Yoshihiro - Ibaraki JP
  • Tezuka; Yoshihiro - Saitama-ken JP
  • Tezuka; Yoshihiro - Tokyo JP
  • Tezuka; Yoshihiro - Kamifukuoka JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Measurement Tool And Method For Lithography Masks
App 20220011679 - TEZUKA; Yoshihiro ;   et al.
2022-01-13
Measurement Tool And Methods For Euv Lithography Masks
App 20220004106 - Tezuka; Yoshihiro ;   et al.
2022-01-06
Detecting and characterizing mask blank defects using angular distribution of scattered light
Grant 7,679,731 - Tezuka March 16, 2
2010-03-16
Method and system of defect inspection for mask blank and method of manufacturing semiconductor device using the same
Grant 7,630,068 - Tanaka , et al. December 8, 2
2009-12-08
Method and system of defect inspection for mask blank and method of manufacturing semiconductor device using the same
App 20070188743 - Tanaka; Toshihiko ;   et al.
2007-08-16
Detecting and characterizing mask blank defects using angular distribution of scattered light
App 20070158636 - Tezuka; Yoshihiro
2007-07-12
Mask blanks inspection tool
Grant 7,220,969 - Tezuka , et al. May 22, 2
2007-05-22
Mask blanks inspection tool
App 20060138338 - Tezuka; Yoshihiro ;   et al.
2006-06-29
Mask Blanks Inspection Method And Mask Blank Inspection Tool
App 20060054836 - Tezuka; Yoshihiro ;   et al.
2006-03-16
Mask blanks inspection method and mask blank inspection tool
Grant 7,005,649 - Tezuka , et al. February 28, 2
2006-02-28
Method and apparatus for photomask fabrication
App 20060027325 - Tezuka; Yoshihiro ;   et al.
2006-02-09
Method and apparatus for photomask fabrication
Grant 6,979,408 - Tezuka , et al. December 27, 2
2005-12-27
Method and apparatus for photomask fabrication
App 20040244912 - Tezuka, Yoshihiro ;   et al.
2004-12-09
Modulation of peripheral critical dimension on photomask with differential electron beam dose
Grant 6,210,843 - Chen , et al. April 3, 2
2001-04-03
Method for depositing a titanium film
Grant 5,942,282 - Tada , et al. August 24, 1
1999-08-24

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