Teunissen; Paulus Antonius Andreas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Teunissen; Paulus Antonius Andreas.The latest application filed is for "mode control of photonic crystal fiber based broadband radiation sources".

Company Profile

1.12.14

Teunissen; Paulus Antonius Andreas - : Eindhoven NL
Teunissen; Paulus Antonius Andreas - Eindhoven NL
Teunissen; Paulus Antonius Andreas - Veldhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mode Control Of Photonic Crystal Fiber Based Broadband Radiation Sources App 20220269183 - Bauerschmidt; Sebastian Thomas ; et al.	2022-08-25
Method Of Manufacture Of A Capillary For A Hollow-core Photonic Crystal Fiber App 20220236479 - Sabert; Hendrik ; et al.	2022-07-28
Mode control of photonic crystal fiber based broadband radiation sources Grant 11,360,396 - Bauerschmidt , et al. June 14, 2	2022-06-14
Method of manufacture of a capillary for a hollow-core photonic crystal fiber Grant 11,333,825 - Sabert , et al. May 17, 2	2022-05-17
Topography measurement system Grant 11,327,412 - Hugers , et al. May 10, 2	2022-05-10
Method Of Manufacture Of A Capillary For A Hollow-core Photonic Crystal Fiber App 20210141150 - SABERT; Hendrik ; et al.	2021-05-13
Mode Control Of Photonic Crystal Fiber Based Broadband Radiation Sources App 20210063894 - BAUERSCHMIDT; Sebastian Thomas ; et al.	2021-03-04
Wavelength combining of multiple source Grant 10,520,824 - Hugers , et al. Dec	2019-12-31
Topography measurement system Grant 10,394,143 - Pandey , et al. A	2019-08-27
Wavelength Combining Of Multiple Source App 20190049864 - HUGERS; Ronald Franciscus Herman ; et al.	2019-02-14
Topography Measurement System App 20180373171 - HUGERS; Ronald Franciscus Herman ; et al.	2018-12-27
Topography Measurement System App 20180267415 - PANDEY; Nitesh ; et al.	2018-09-20
Method and lithographic apparatus for measuring and acquiring height data relating to a substrate surface Grant 8,582,082 - Staals , et al. November 12, 2	2013-11-12
Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby Grant 7,646,471 - Teunissen , et al. January 12, 2	2010-01-12
Method and Lithographic Apparatus for Acquiring Height Data Relating to a Substrate Surface App 20090262320 - Staals; Frank ; et al.	2009-10-22
Method and Lithographic Apparatus for Measuring and Acquiring Height Data Relating to a Substrate Surface App 20090231563 - Staals; Frank ; et al.	2009-09-17
Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby App 20080036988 - Teunissen; Paulus Antonius Andreas ; et al.	2008-02-14
Level sensor for lithographic apparatus Grant 7,265,364 - Teunissen , et al. September 4, 2	2007-09-04
Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby Grant 7,248,337 - Teunissen , et al. July 24, 2	2007-07-24
Lithographic apparatus, device manufacturing method, and device manufactured thereby Grant 6,987,555 - Teunissen , et al. January 17, 2	2006-01-17
Level sensor for lithographic apparatus App 20050274909 - Teunissen, Paulus Antonius Andreas ; et al.	2005-12-15
Lithographic apparatus, device manufacturing method, and device manufactured thereby Grant 6,906,785 - Queens , et al. June 14, 2	2005-06-14
Lithographic apparatus, device manufacturing method, and device manufactured thereby App 20050030507 - Teunissen, Paulus Antonius Andreas ; et al.	2005-02-10
Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby App 20040165169 - Teunissen, Paulus Antonius Andreas ; et al.	2004-08-26
Lithographic apparatus, device manufacturing method, and device manufactured thereby App 20030218141 - Queens, Rene Marinus Gerardus Johan ; et al.	2003-11-27

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