TETSUO SAKAKI
Patent Applications and Registrations
Patent applications and USPTO patent grants for TETSUO SAKAKI.The latest application filed is for "flaw detector and flaw detection method for silicon layer of wafer".
- TETSUO SAKAKI - KAWASAKI-SHI JP
| Patent | Date |
|---|---|
| Flaw Detector and Flaw Detection Method For Silicon Layer of Wafer App 20090051358 - Shirasaka; Tomohisa ; et al. | 2009-02-26 |
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