Patent applications and USPTO patent grants for Test Research, Inc..The latest application filed is for "system and method of testing single dut through multiple cores in parallel".
Patent | Date |
---|---|
System And Method Of Testing Single Dut Through Multiple Cores In Parallel App 20220308109 - LIN; Ching-Chih ;   et al. | 2022-09-29 |
Test system and method of operating the same Grant 11,067,623 - Liu , et al. July 20, 2 | 2021-07-20 |
Test System And Method Of Operating The Same App 20200363465 - LIU; Ming-Hsien ;   et al. | 2020-11-19 |
Apparatus and method for three-dimensional inspection Grant 10,841,561 - Lee , et al. November 17, 2 | 2020-11-17 |
Optical inspection apparatus Grant 10,600,174 - Wang | 2020-03-24 |
Automatic optical inspection system and operating method thereof Grant 10,438,340 - Wen , et al. O | 2019-10-08 |
Multi-chassis test device and test signal transmission apparatus of the same Grant 10,156,606 - Shen , et al. Dec | 2018-12-18 |
Test device and alternating current power detection method of the same Grant 10,139,454 - Huang , et al. Nov | 2018-11-27 |
Automatic Optical Inspection System And Operating Method Thereof App 20180276811 - WEN; Kuang-Pu ;   et al. | 2018-09-27 |
Apparatus And Method For Three-dimensional Inspection App 20180278911 - LEE; Wen-Tzong ;   et al. | 2018-09-27 |
Optical inspection system Grant 9,885,561 - Yu , et al. February 6, 2 | 2018-02-06 |
Inspection method and device Grant 9,841,387 - Yu , et al. December 12, 2 | 2017-12-12 |
Inspecting device and method for inspecting inspection target Grant 9,838,612 - Wang , et al. December 5, 2 | 2017-12-05 |
Inspection system and method for controlling the same Grant 9,791,387 - Cheng , et al. October 17, 2 | 2017-10-17 |
Test Device And Alternating Current Power Detection Method Of The Same App 20170205471 - HUANG; Hsin-Wei ;   et al. | 2017-07-20 |
Test Device And Alternating Current Power Detection Method Of The Same App 20170205449 - Kao; Cheng-Hung ;   et al. | 2017-07-20 |
Multi-chassis Test Device And Test Signal Transmission Apparatus Of The Same App 20170192056 - SHEN; Yu-Chen ;   et al. | 2017-07-06 |
Optical Inspection Apparatus App 20170186150 - Wang; Yeong-Feng | 2017-06-29 |
Optical system and image compensating method of optical apparatus Grant 9,686,517 - Yu , et al. June 20, 2 | 2017-06-20 |
Testing apparatus for providing per pin level setting Grant 9,562,947 - Chen , et al. February 7, 2 | 2017-02-07 |
Inspection Method And Device App 20170023494 - YU; Liang-Pin ;   et al. | 2017-01-26 |
Inspecting Device And Method For Inspecting Inspection Target App 20170019578 - WANG; Yeong-Feng ;   et al. | 2017-01-19 |
Optical system Grant 9,485,491 - Yu , et al. November 1, 2 | 2016-11-01 |
Three-dimensional measurement system Grant 9,423,246 - Yu , et al. August 23, 2 | 2016-08-23 |
Board-warping measuring apparatus and board-warping measuring method thereof Grant 9,423,242 - Yu , et al. August 23, 2 | 2016-08-23 |
Measuring system for a 3D object Grant 9,420,235 - Wen , et al. August 16, 2 | 2016-08-16 |
Board-warping Measuring Apparatus And Board-warping Measuring Method Thereof App 20160209206 - YU; Liang-Pin ;   et al. | 2016-07-21 |
Optical Inspection System App 20160169812 - YU; Liang-Pin ;   et al. | 2016-06-16 |
Optical System App 20160173853 - YU; Liang-Pin ;   et al. | 2016-06-16 |
Optical System And Image Compensating Method Of Optical Apparatus App 20160173836 - YU; Liang-Pin ;   et al. | 2016-06-16 |
Inspection System And Method For Controlling The Same App 20160091441 - CHENG; Yu-Che ;   et al. | 2016-03-31 |
Testing apparatus with backdriving protection function Grant 9,140,755 - Kuo , et al. September 22, 2 | 2015-09-22 |
Three-dimensional image measuring apparatus Grant 9,019,351 - Yu , et al. April 28, 2 | 2015-04-28 |
Device and method for performing timing analysis Grant 9,015,541 - Shen , et al. April 21, 2 | 2015-04-21 |
Testing Apparatus For Providing Per Pin Level Setting App 20140285228 - CHEN; Hsin-Hao ;   et al. | 2014-09-25 |
Electrical connection defect simulation test method and system of the same Grant 8,843,357 - Tsai , et al. September 23, 2 | 2014-09-23 |
Testing Apparatus With Backdriving Protection Function App 20140247530 - KUO; Po-Shen ;   et al. | 2014-09-04 |
Fixture, System And Method For Performing Functional Test App 20140225633 - TSAI; Su-Wei ;   et al. | 2014-08-14 |
Device And Method For Performing Timing Analysis App 20140201581 - SHEN; Yu-Chen ;   et al. | 2014-07-17 |
Signal transition detection circuit and method of the same Grant 8,767,900 - Shen , et al. July 1, 2 | 2014-07-01 |
Three-dimensional Image Measuring Apparatus App 20140022357 - YU; Liang-Pin ;   et al. | 2014-01-23 |
Three-dimensional Measurement System App 20140009580 - YU; Liang-Pin ;   et al. | 2014-01-09 |
Three-dimensional Measurement System And Three-dimensional Measurement Method App 20130278723 - YU; Liang-Pin ;   et al. | 2013-10-24 |
Signal Transition Detection Circuit And Method Of The Same App 20130223493 - Shen; Yu-Chen ;   et al. | 2013-08-29 |
Electrical connection defect detection system and method Grant 8,350,575 - Tsai , et al. January 8, 2 | 2013-01-08 |
Electrical connection defect detection device Grant 8,324,908 - Tsai , et al. December 4, 2 | 2012-12-04 |
Electrical Connection Defect Simulation Test Method And System Of The Same App 20120173214 - Tsai; Su-Wei ;   et al. | 2012-07-05 |
Discharge Device And Test System Having The Same App 20120161779 - Shiau; Jiau-Cheng ;   et al. | 2012-06-28 |
Apparatus for testing printed circuit and method therefor Grant 8,179,143 - Yeh , et al. May 15, 2 | 2012-05-15 |
Method for thickness calibration and measuring thickness of material Grant 8,077,827 - Perng December 13, 2 | 2011-12-13 |
Method For Thickness Calibration And Measuring Thickness Of Material App 20110206182 - PERNG; Ming-Hwei | 2011-08-25 |
Electronic device testing system and method Grant 7,855,567 - Tsai , et al. December 21, 2 | 2010-12-21 |
Electronic device testing system and method Grant 7,702,982 - Chen , et al. April 20, 2 | 2010-04-20 |
Apparatus For Testing Printed Circuit And Method Therefor App 20100090679 - YEH; Shang-Tsang ;   et al. | 2010-04-15 |
Open-circuit testing system and method Grant 7,612,568 - Chen , et al. November 3, 2 | 2009-11-03 |
Electronic Device Testing System and Method App 20090243642 - Tsai; Su-Wei ;   et al. | 2009-10-01 |
System and method for laminography inspection Grant 7,529,336 - Wen , et al. May 5, 2 | 2009-05-05 |
Electronic Device Testing System and Method App 20090089635 - Chen; Chia-Ming ;   et al. | 2009-04-02 |
System and Method for Laminography Inspection App 20080298538 - Wen; Kuang Pu ;   et al. | 2008-12-04 |
Open-Circuit Testing System and Method App 20080218175 - Chen; Chien-Wei ;   et al. | 2008-09-11 |
Optical-enhanced apparatus and method for illuminating printed circuit boards for inspection App 20040150714 - Lin, Don | 2004-08-05 |
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