Terazawa; Toshihiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Terazawa; Toshihiro.The latest application filed is for "scan test circuit".
- Terazawa; Toshihiro - Kanagawa JP
- Terazawa, Toshihiro - Kanagawa-ken JP
| Patent | Date |
|---|---|
| Scan test circuit Grant 7,152,195 - Terazawa December 19, 2 | 2006-12-19 |
| Semiconductor integrated circuit Grant 7,092,313 - Terazawa , et al. August 15, 2 | 2006-08-15 |
| Scan test circuit App 20050138510 - Terazawa, Toshihiro | 2005-06-23 |
| Semiconductor integrated circuit App 20050094446 - Terazawa, Toshihiro ; et al. | 2005-05-05 |
| Hold violation improvement method, semiconductor integrated circuit, and program for executing hold violation improvement method by computer App 20010007144 - Terazawa, Toshihiro | 2001-07-05 |
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