Terauchi; Youji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Terauchi; Youji.The latest application filed is for "flash memory and data erasing method of the same".

Company Profile

0.7.6

Terauchi; Youji - Kanagawa JP
Terauchi; Youji - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Flash memory and data erasing method of the same Grant 8,335,113 - Terauchi December 18, 2	2012-12-18
Memory control circuit, semiconductor integrated circuit, and verification method of nonvolatile memory Grant 8,117,509 - Terauchi February 14, 2	2012-02-14
Flash memory, memory control circuit, microcomputer and memory control method Grant 8,041,880 - Terauchi October 18, 2	2011-10-18
Flash Memory And Data Erasing Method Of The Same App 20100259994 - TERAUCHI; Youji	2010-10-14
Data processing apparatus, memory controlling circuit, and memory controlling method App 20100083073 - Terauchi; Youji	2010-04-01
Memory control circuit, microcomputer, and data rewriting method Grant 7,596,036 - Kondo , et al. September 29, 2	2009-09-29
Memory control circuit, semiconductor integrated circuit, and verification method of nonvolatile memory App 20090063792 - Terauchi; Youji	2009-03-05
Memory control circuit, microcomputer, and data rewriting method App 20070297237 - Kondo; Takao ; et al.	2007-12-27
Flash memory, memory control circuit, microcomputer and memory control method App 20070140007 - Terauchi; Youji	2007-06-21
Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells Grant 7,136,771 - Terauchi November 14, 2	2006-11-14
Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells App 20050114063 - Terauchi, Youji	2005-05-26
Microcomputer loaded with PROM and data read-out testing method for same Grant 5,905,907 - Terauchi May 18, 1	1999-05-18
Semiconductor device on semiconductor wafer having simple wirings for test and capable of being tested in a short time Grant 5,862,147 - Terauchi January 19, 1	1999-01-19

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