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Metalens unit, semiconductor fault analysis device, and semiconductor fault analysis method
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Semiconductor Apparatus Examination Method And Semiconductor Apparatus Examination Apparatus
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Confocal Microscope Unit And Confocal Microscope
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Scanning Microscope Unit
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Confocal Microscope Unit And Confocal Microscope
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Cooling Unit, Objective Lens Module, Semiconductor Inspection Device, And Semiconductor Inspection Method
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Solid Immersion Lens Unit And Semiconductor Inspection Device
App 20210333216 - MAO; Xiangguang ; et al. | 2021-10-28 |
Metalens Unit, Semiconductor Fault Analysis Device, And Semiconductor Fault Analysis Method
App 20210239752 - UENOYAMA; Soh ; et al. | 2021-08-05 |
Inspection system and inspection method
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Photostimulation device and photostimulation method
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Solid immersion lens holder and image acquisition device
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Solid immersion lens holder and image acquisition device
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Optical module and observation device
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Inspection System And Inspection Method
App 20190221486 - SUZUKI; Shinsuke ; et al. | 2019-07-18 |
Inspection system and inspection method
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Microscope device and image acquisition method
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Optical Unit And Method For Adjusting Optical Unit
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Photostimulation Device And Photostimulation Method
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Photostimulation device and photostimulation method
Grant 10,073,076 - Matsumoto , et al. September 11, 2 | 2018-09-11 |
Microscope Device And Image Acquisition Method
App 20180143137 - MATSUMOTO; Naoya ; et al. | 2018-05-24 |
Microscope device and image acquisition method
Grant 9,891,172 - Matsumoto , et al. February 13, 2 | 2018-02-13 |
Inspection System And Inspection Method
App 20180033704 - SUZUKI; Shinsuke ; et al. | 2018-02-01 |
Optical module and light exposure device
Grant 9,784,980 - Inoue , et al. October 10, 2 | 2017-10-10 |
Solid Immersion Lens Holder And Image Acquisition Device
App 20170285296 - TERADA; Hirotoshi ; et al. | 2017-10-05 |
Solid Immersion Lens Holder And Image Acquisition Device
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Microscope Device And Image Acquisition Method
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Photostimulation Device And Photostimulation Method
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Optical Module And Light Exposure Device
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Optical Module And Observation Device
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Suction apparatus, semiconductor device observation device, and semiconductor device observation method
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Immersion lens holding device
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Immersion lens holding device
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Observing device and method
Grant 8,582,202 - Terada , et al. November 12, 2 | 2013-11-12 |
Image Generation Device
App 20130120563 - Terada; Hirotoshi ; et al. | 2013-05-16 |
Image Generation Device
App 20130100283 - Terada; Hirotoshi | 2013-04-25 |
Suction Apparatus, Semiconductor Device Observation Device, And Semiconductor Device Observation Method
App 20130088714 - Terada; Hirotoshi ; et al. | 2013-04-11 |
Immersion Lens Holding Device
App 20120113534 - Arata; Ikuo ; et al. | 2012-05-10 |
Solid immersion lens holder
Grant 8,094,389 - Terada , et al. January 10, 2 | 2012-01-10 |
Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program
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Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
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Observing Device And Method
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Solid Immersion Lens Holder
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Microscope and sample observation method
Grant 7,576,910 - Terada , et al. August 18, 2 | 2009-08-18 |
Solid immersion lens holder
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Fluorescence lifetime distribution image measuring system and its measuring method
Grant 7,453,567 - Saitoh , et al. November 18, 2 | 2008-11-18 |
Solid immersion lens and microscope
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Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method
App 20080158667 - Arata; Ikuo ; et al. | 2008-07-03 |
Sample observation method, microscope, and solid immersion lens; optical contact liquid used in the method
App 20080137064 - Arata; Ikuo ; et al. | 2008-06-12 |
Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method
Grant 7,359,115 - Arata , et al. April 15, 2 | 2008-04-15 |
Microscope and sample observation method
App 20080074739 - Terada; Hirotoshi ; et al. | 2008-03-27 |
Microscope and sample observation method
Grant 7,312,921 - Terada , et al. December 25, 2 | 2007-12-25 |
Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
App 20070294053 - Majima; Toshiyuki ; et al. | 2007-12-20 |
Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
App 20070292018 - Majima; Toshiyuki ; et al. | 2007-12-20 |
Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
App 20070290696 - Majima; Toshiyuki ; et al. | 2007-12-20 |
Solid immersion lens and microscope
App 20070183057 - Terada; Hirotoshi ; et al. | 2007-08-09 |
Microscope and sample observation method
App 20070146871 - Terada; Hirotoshi ; et al. | 2007-06-28 |
Laser beam inspection equipment
Grant 7,230,436 - Terada , et al. June 12, 2 | 2007-06-12 |
Microscope and sample observation method
Grant 7,221,502 - Terada , et al. May 22, 2 | 2007-05-22 |
Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program
App 20070020781 - Majima; Toshiyuki ; et al. | 2007-01-25 |
Solid immersion lens and sample observation method using it
Grant 7,149,036 - Arata , et al. December 12, 2 | 2006-12-12 |
Imaging apparatus
Grant 7,139,073 - Terada November 21, 2 | 2006-11-21 |
Microscope and sample observation method
Grant 7,110,172 - Terada , et al. September 19, 2 | 2006-09-19 |
Microscope and sample observation method
App 20060176548 - Terada; Hirotoshi ; et al. | 2006-08-10 |
Laser beam inspection equipment
App 20060164109 - Terada; Hirotoshi ; et al. | 2006-07-27 |
Solid immersion lens and sample observation method using it
App 20060109562 - Arata; Ikuo ; et al. | 2006-05-25 |
Solid immersion lens and sample observation method using it
Grant 7,046,449 - Arata , et al. May 16, 2 | 2006-05-16 |
Variable-wavelength optical output device
Grant 6,973,233 - Tomita , et al. December 6, 2 | 2005-12-06 |
Microscope and sample observation method
App 20050190436 - Terada, Hirotoshi ; et al. | 2005-09-01 |
Fluorescence lifetime distribution image measuring system and its measuring method
App 20050157292 - Saitoh, Haruhisa ; et al. | 2005-07-21 |
Solid immersion lens holder
App 20050094293 - Tanabe, Hiroshi ; et al. | 2005-05-05 |
Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method
App 20050063046 - Arata, Ikuo ; et al. | 2005-03-24 |
Solid immersion lens and sample observation method using it
App 20040240075 - Arata, Ikuo ; et al. | 2004-12-02 |
Microscope and sample observation method
App 20040240051 - Terada, Hirotoshi ; et al. | 2004-12-02 |
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