loadpatents
Patent applications and USPTO patent grants for Teng; Cheng-Yung.The latest application filed is for "product verification system".
Patent | Date |
---|---|
Circuit test apparatus Grant 8,421,474 - Teng , et al. April 16, 2 | 2013-04-16 |
Handler and method for testing the same Grant 8,269,517 - Teng , et al. September 18, 2 | 2012-09-18 |
Method for measuring transconductance Grant 8,242,769 - Teng , et al. August 14, 2 | 2012-08-14 |
Circuit testing apparatus Grant 8,228,384 - Teng , et al. July 24, 2 | 2012-07-24 |
Circuit testing apparatus Grant 8,175,824 - Teng , et al. May 8, 2 | 2012-05-08 |
Circuit testing apparatus Grant 8,148,996 - Teng , et al. April 3, 2 | 2012-04-03 |
Audio generating module Grant 8,116,475 - Teng February 14, 2 | 2012-02-14 |
Test system Grant 8,037,089 - Teng , et al. October 11, 2 | 2011-10-11 |
Circuit testing apparatus Grant 7,908,108 - Teng , et al. March 15, 2 | 2011-03-15 |
Testing circuit board for preventing tested chip positions from being wrongly positioned Grant 7,855,571 - Teng , et al. December 21, 2 | 2010-12-21 |
Testing circuit board for testing devices under test Grant 7,830,163 - Teng , et al. November 9, 2 | 2010-11-09 |
Method For Measuring Transconductance App 20100164481 - TENG; Cheng-Yung ;   et al. | 2010-07-01 |
Product Verification System App 20100168899 - Teng; Cheng-Yung ;   et al. | 2010-07-01 |
Handler And Method For Testing The Same App 20100154505 - Teng; Cheng-Yung ;   et al. | 2010-06-24 |
Circuit testing apparatus Grant 7,706,999 - Teng , et al. April 27, 2 | 2010-04-27 |
Circuit testing apparatus for testing a device under test Grant 7,642,801 - Teng , et al. January 5, 2 | 2010-01-05 |
Circuit Testing Apparatus App 20090326844 - Teng; Cheng-Yung ;   et al. | 2009-12-31 |
Circuit Test Apparatus App 20090302861 - Teng; Cheng-Yung ;   et al. | 2009-12-10 |
Testing Devices App 20090281744 - Teng; Cheng-Yung ;   et al. | 2009-11-12 |
Circuit Testing Apparatus App 20090254296 - Teng; Cheng-Yung ;   et al. | 2009-10-08 |
Audio Generating Module App 20090168605 - TENG; Cheng-Yung | 2009-07-02 |
Remote Controller App 20090140877 - TENG; Cheng-Yung ;   et al. | 2009-06-04 |
Testing Circuit Board App 20090140746 - TENG; Cheng-Yung ;   et al. | 2009-06-04 |
Testing Circuit Board App 20090108859 - TENG; Cheng-Yung ;   et al. | 2009-04-30 |
Test System App 20090113260 - TENG; Cheng-Yung ;   et al. | 2009-04-30 |
Circuit testing apparatus App 20090015288 - Teng; Cheng-Yung ;   et al. | 2009-01-15 |
Circuit testing apparatus App 20080243409 - Teng; Cheng-Yung ;   et al. | 2008-10-02 |
Circuit testing apparatus App 20080191730 - Teng; Cheng-Yung ;   et al. | 2008-08-14 |
Interface circuit for using a low voltage logic tester to test a high voltage IC Grant 7,383,477 - Teng , et al. June 3, 2 | 2008-06-03 |
Circuit Testing Apparatus App 20080063212 - Teng; Cheng-Yung ;   et al. | 2008-03-13 |
Circuit Testing Apparatus App 20070268037 - Teng; Cheng-Yung ;   et al. | 2007-11-22 |
Interace circuit for using a low voltage logic tester to test a high voltage IC App 20070168787 - Teng; Cheng Yung ;   et al. | 2007-07-19 |
Test system and single-chip tester capable of testing a plurality of chips simultaneously App 20070024314 - Teng; Cheng-Yung ;   et al. | 2007-02-01 |
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