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Patent applications and USPTO patent grants for Teh; Cho H..The latest application filed is for "methods and apparatus for classification of defects using surface height attributes".
Patent | Date |
---|---|
Methods and apparatus for classification of defects using surface height attributes Grant 8,502,146 - Chen , et al. August 6, 2 | 2013-08-06 |
Methods And Apparatus For Classification Of Defects Using Surface Height Attributes App 20130082174 - CHEN; Chien-Huei ;   et al. | 2013-04-04 |
Process excursion detection Grant 8,289,510 - Huet , et al. October 16, 2 | 2012-10-16 |
Process Excursion Detection App 20110137576 - Huet; Patrick Y. ;   et al. | 2011-06-09 |
Process Excursion Detection App 20100067781 - Huet; Patrick Y. ;   et al. | 2010-03-18 |
Process excursion detection Grant 7,646,476 - Huet , et al. January 12, 2 | 2010-01-12 |
Process Excursion Detection App 20080204739 - Huet; Patrick Y. ;   et al. | 2008-08-28 |
Process excursion detection Grant 7,394,534 - Huet , et al. July 1, 2 | 2008-07-01 |
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