TECH Semiconductor Singapore Pte Ltd

Patent Applications and Registrations

Patent applications and USPTO patent grants for TECH Semiconductor Singapore Pte Ltd.The latest application filed is for "method to improve transistor performance matching for plasma-assisted source/drain formation".

Company Profile

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TECH Semiconductor Singapore Pte Ltd -
TECH Semiconductor Singapore Pte Ltd - Singapore SG
TECH Semiconductor Singapore Pte. Ltd. - Singapore SG

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method to improve transistor performance matching for plasma-assisted source/drain formation App 20110201185 - Datta; Devesh Kumar ; et al.	2011-08-18
Method of process trend matching for identification of process variable Grant 7,813,893 - Fong , et al. October 12, 2	2010-10-12
Real-time detection of wafer shift/slide in a chamber Grant 7,750,819 - Lim July 6, 2	2010-07-06
Method for data collection during manufacturing processes Grant 7,680,556 - Sim , et al. March 16, 2	2010-03-16
Method and system for wafer lot order Grant 7,610,111 - Lin , et al. October 27, 2	2009-10-27
Real-time detection of wafer shift/slide in a chamber App 20090249880 - Lim; Khoon Peng	2009-10-08
Method and system for reticle scheduling App 20080201003 - Maskara; Ashish ; et al.	2008-08-21
Method and system for wafer lot order App 20080195241 - Lin; Cheng ; et al.	2008-08-14
Method for passivation of plasma etch defects in DRAM devices Grant 7,407,871 - Kumar , et al. August 5, 2	2008-08-05
Method for passivation of plasma etch defects in DRAM devices App 20080124814 - Kumar; Arvind ; et al.	2008-05-29
Method to identify machines causing excursion in semiconductor manufacturing Grant 7,363,098 - Ng , et al. April 22, 2	2008-04-22
Real time monitoring of particulate contamination in a wafer processing chamber Grant 7,248,975 - Lim , et al. July 24, 2	2007-07-24
Method to identify machines causing excursion in semiconductor manufacturing App 20070142951 - Ng; Choy Yow ; et al.	2007-06-21
Real time monitoring of particulate contamination in a wafer processing chamber App 20070067117 - Lim; Khoon Peng ; et al.	2007-03-22
Real time monitoring of CMP pad conditioning process Grant 7,163,435 - Lim , et al. January 16, 2	2007-01-16
Retaining ring structure for edge control during chemical-mechanical polishing Grant 7,121,927 - Phang , et al. October 17, 2	2006-10-17
Real Time Monitoring Of Cmp Pad Conditioning Process App 20060172662 - Lim; Khoon Peng ; et al.	2006-08-03
Method for data collection during manufacturing processes App 20060106921 - Sim; Boon Hong ; et al.	2006-05-18
Method for monitoring ion implant doses Grant 7,029,933 - Wee , et al. April 18, 2	2006-04-18
Retaining Ring Structure For Edge Control During Chemical-mechanical Polishing App 20060046621 - Phang; Yew Hoong ; et al.	2006-03-02
Method for monitoring ion implant doses App 20050282366 - Wee, Siew Fong ; et al.	2005-12-22
Method for depositing a very high phosphorus doped silicon oxide film Grant 6,893,983 - Sun , et al. May 17, 2	2005-05-17

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