loadpatents
name:-0.012756109237671
name:-0.025080919265747
name:-0.00099992752075195
Taya; Shunroku Patent Filings

Taya; Shunroku

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taya; Shunroku.The latest application filed is for "monochromator and scanning electron microscope using the same".

Company Profile
0.20.10
  • Taya; Shunroku - Mito JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Element mapping unit, scanning transmission electron microscope, and element mapping method
Grant 7,928,376 - Kaji , et al. April 19, 2
2011-04-19
Monochromator and scanning electron microscope using the same
Grant 7,838,827 - Ose , et al. November 23, 2
2010-11-23
Monochromator and scanning electron microscope using the same
App 20080237463 - Ose; Yoichi ;   et al.
2008-10-02
Monochromator and scanning electron microscope using the same
Grant 7,315,024 - Ose , et al. January 1, 2
2008-01-01
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
Grant 7,250,601 - Kaji , et al. July 31, 2
2007-07-31
Monochromator and scanning electron microscope using the same
App 20060219910 - Ose; Yoichi ;   et al.
2006-10-05
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
App 20060163479 - Kaji; Kazutoshi ;   et al.
2006-07-27
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
Grant 7,067,805 - Kajl , et al. June 27, 2
2006-06-27
Monochromator and scanning electron microscope using the same
Grant 7,022,983 - Ose , et al. April 4, 2
2006-04-04
Element mapping unit, scanning transmission electron microscope, and element mapping method
App 20060011836 - Kaji; Kazutoshi ;   et al.
2006-01-19
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
Grant 6,933,501 - Kaji , et al. August 23, 2
2005-08-23
Monochromator and scanning electron microscope using the same
App 20040188607 - Ose, Yoichi ;   et al.
2004-09-30
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
App 20040183011 - Kaji, Kazutoshi ;   et al.
2004-09-23
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
Grant 6,794,648 - Kaji , et al. September 21, 2
2004-09-21
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
App 20040169143 - Kaji, Kazutoshi ;   et al.
2004-09-02
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
Grant 6,703,613 - Kaji , et al. March 9, 2
2004-03-09
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
App 20030085356 - Kaji, Kazutoshi ;   et al.
2003-05-08
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
App 20030085350 - Kaji, Kazutoshi ;   et al.
2003-05-08
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
App 20020096632 - Kaji, Kazutoshi ;   et al.
2002-07-25
Projecting type charged particle microscope and projecting type substrate inspection system
Grant 6,310,341 - Todokoro , et al. October 30, 2
2001-10-30
Energy filter and electron microscope equipped with the energy filter
Grant 6,150,657 - Kimoto , et al. November 21, 2
2000-11-21
Electron energy filter and transmission electron microscope provided with the same
Grant 5,585,630 - Taniguchi , et al. December 17, 1
1996-12-17
Electrostatic lens arrangement of multi-stages of multi-pole electrodes and mass spectrometer using the same
Grant 5,291,016 - Taya March 1, 1
1994-03-01
Analyzer tube for mass spectrometry
Grant 4,947,041 - Taya August 7, 1
1990-08-07
Electric multipole lens
Grant 4,870,283 - Taya September 26, 1
1989-09-26
Ion implantation apparatus for semiconductor manufacture
Grant 4,839,523 - Taya , et al. June 13, 1
1989-06-13
Microwave discharge type ion source for ion injection devices
Grant 4,703,180 - Taya October 27, 1
1987-10-27
Ion implanter
Grant 4,634,931 - Taya , et al. January 6, 1
1987-01-06
Specimens rotating device
Grant 4,599,516 - Taya , et al. July 8, 1
1986-07-08
Ion implantation apparatus
Grant 4,476,393 - Taya , et al. October 9, 1
1984-10-09

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