Tau-Metrix, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tau-Metrix, Inc..The latest application filed is for "integrated photodiode for semiconductor substrates".

Company Profile

0.13.3

Tau-Metrix, Inc. - Santa Clara CA US
tau-Metrix, Inc. - Fremont CA
tau-Metrix, Inc. - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated Photodiode For Semiconductor Substrates App 20160104812 - Steinbrueck; Gary ; et al.	2016-04-14
Contactless technique for evaluating a fabrication of a wafer Grant 8,990,759 - Aghababazadeh , et al. March 24, 2	2015-03-24
Integrated photodiode for semiconductor substrates Grant 8,872,297 - Steinbrueck , et al. October 28, 2	2014-10-28
Integrated Photodiode For Semiconductor Substrates App 20130334644 - Steinbrueck; Gary ; et al.	2013-12-19
Integrated photodiode for semiconductor substrates Grant 8,410,568 - Steinbrueck , et al. April 2, 2	2013-04-02
Test structures for evaluating a fabrication of a die or a wafer Grant 8,344,745 - Aghababazadeh , et al. January 1, 2	2013-01-01
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,736,916 - Aghababazadeh , et al. June 15, 2	2010-06-15
Contactless technique for evaluating a fabrication of a wafer Grant 7,730,434 - Aghababazadeh , et al. June 1, 2	2010-06-01
System for using test structures to evaluate a fabrication of a wafer Grant 7,723,724 - Aghababazadeh , et al. May 25, 2	2010-05-25
Intra-chip power and test signal generation for use with test structures on wafers Grant 7,605,597 - Aghababazadeh , et al. October 20, 2	2009-10-20
Technique for evaluating a fabrication of a die and wafer Grant 7,423,288 - Aghababazadeh , et al. September 9, 2	2008-09-09
Intra-clip power and test signal generation for use with test structures on wafers Grant 7,339,388 - Aghababazadeh , et al. March 4, 2	2008-03-04
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,256,055 - Aghababazadeh , et al. August 14, 2	2007-08-14
Technique for evaluating a fabrication of a die and wafer Grant 7,220,990 - Aghababazadeh , et al. May 22, 2	2007-05-22

Company Registrations

SEC

0001362978

tau Metrix Inc

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