Tarshish-Shapir; Inna
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tarshish-Shapir; Inna.The latest application filed is for "composite overlay metrology target".
- Tarshish-Shapir; Inna - Yokneam Illit IL
- Tarshish-Shapir; Inna - Haifa IL
- Tarshish-Shapir; Inna - Yokneam Ilit IL
| Patent | Date |
|---|---|
| Metrology targets and methods with oblique periodic structures Grant 11,137,692 - Feler , et al. October 5, 2 | 2021-10-05 |
| Composite Overlay Metrology Target App 20210240089 - Golotsvan; Anna ; et al. | 2021-08-05 |
| Field-to-field Corrections Using Overlay Targets App 20210200105 - Leshinsky-Altshuller; Enna ; et al. | 2021-07-01 |
| Field-to-field corrections using overlay targets Grant 10,990,022 - Leshinsky-Altshuller , et al. April 27, 2 | 2021-04-27 |
| Verification Metrology Targets and Their Design App 20200348604 - Adel; Michael E. ; et al. | 2020-11-05 |
| Verification metrology target and their design Grant 10,705,434 - Adel , et al. | 2020-07-07 |
| Field-to-Field Corrections Using Overlay Targets App 20200201193 - Leshinsky-Altshuller; Enna ; et al. | 2020-06-25 |
| Metrology Targets And Methods With Oblique Periodic Structures App 20200124982 - Feler; Yoel ; et al. | 2020-04-23 |
| Method, system, and user interface for metrology target characterization Grant 10,242,290 - Tarshish-Shapir , et al. | 2019-03-26 |
| Verification Metrology Targets And Their Design App 20170060001 - Adel; Michael E. ; et al. | 2017-03-02 |
| Metrology Target Characterization App 20140136137 - Tarshish-Shapir; Inna ; et al. | 2014-05-15 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 