TARABRIN; Sergey

Patent Applications and Registrations

Patent applications and USPTO patent grants for TARABRIN; Sergey.The latest application filed is for "metrology method and associated computer product".

Company Profile

8.8.10

TARABRIN; Sergey - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology Method And Associated Computer Product App 20220252990 - JAVAHERI; Narjes ; et al.	2022-08-11
Method and apparatus to determine a patterning process parameter Grant 11,409,204 - Tarabrin August 9, 2	2022-08-09
Method For Metrology Optimization App 20220082944 - REHMAN; Samee Ur ; et al.	2022-03-17
Method of measuring a parameter of a patterning process, metrology apparatus, target Grant 11,150,563 - Sokolov , et al. October 19, 2	2021-10-19
Measurement apparatus and method of measuring a target Grant 11,042,100 - Lian , et al. June 22, 2	2021-06-22
Method of determining a value of a parameter of interest, method of cleaning a signal containing information about a parameter of interest, device manufacturing method Grant 10,795,269 - Zhou , et al. October 6, 2	2020-10-06
Method And Apparatus To Determine A Patterning Process Parameter App 20200285157 - TARABRIN; Sergey	2020-09-10
Method and apparatus to determine a patterning process parameter Grant 10,691,031 - Tarabrin	2020-06-23
Method Of Measuring A Parameter Of A Patterning Process, Metrology Apparatus, Target App 20200192230 - SOKOLOV; Sergei ; et al.	2020-06-18
Metrology apparatus, method of measuring a structure, device manufacturing method Grant 10,599,048 - Tarabrin , et al.	2020-03-24
Metrology method, apparatus and computer program Grant 10,598,483 - Tarabrin , et al.	2020-03-24
Method of determining a value of a parameter of interest of a target formed by a patterning process Grant 10,585,048 - Rehman , et al.	2020-03-10
Measurement Apparatus and Method of Measuring a Target App 20190369505 - LIAN; Jin ; et al.	2019-12-05
Method Of Determining A Value Of A Parameter Of Interest Of A Target Formed By A Patterning Process App 20190323972 - REHMAN; Samee Ur ; et al.	2019-10-24
Method Of Determining A Value Of A Parameter Of Interest, Method Of Cleaning A Signal Containing Information About A Parameter Of Interest, Device Manufacturing Method App 20190129316 - ZHOU; Zili ; et al.	2019-05-02
Metrology Apparatus, Method of Measuring a Structure, Device Manufacturing Method App 20190129315 - Tarabrin; Sergey ; et al.	2019-05-02
Method And Apparatus To Determine A Patterning Process Parameter App 20190072862 - TARABRIN; Sergey	2019-03-07
Metrology Method, Apparatus and Computer Program App 20180073866 - Tarabrin; Sergey ; et al.	2018-03-15

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