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name:-0.015786170959473
name:-0.012462139129639
name:-0.00061798095703125
Tappel; Hendrik Gezinus Patent Filings

Tappel; Hendrik Gezinus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tappel; Hendrik Gezinus.The latest application filed is for "user interface for an electron microscope".

Company Profile
0.12.12
  • Tappel; Hendrik Gezinus - Casteren NL
  • Tappel; Hendrik Gezinus - Eindhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
User interface for an electron microscope
Grant 9,865,427 - Bierhoff , et al. January 9, 2
2018-01-09
User Interface For An Electron Microscope
App 20150332891 - BIERHOFF; MART PETRUS MARIA ;   et al.
2015-11-19
User interface for an electron microscope
Grant 9,025,018 - Bierhoff , et al. May 5, 2
2015-05-05
Hermetically sealed housing with electrical feed-in
Grant 8,354,587 - Tappel , et al. January 15, 2
2013-01-15
Compact scanning electron microscope
Grant 8,309,921 - Bierhoff , et al. November 13, 2
2012-11-13
Compact Scanning Electron Microscope
App 20110133083 - BIERHOFF; MART PETRUS MARIA ;   et al.
2011-06-09
Compact scanning electron microscope
Grant 7,906,762 - Bierhoff , et al. March 15, 2
2011-03-15
Compact Scanning Electron Microscope
App 20100230590 - Bierhoff; Mart Petrus Maria ;   et al.
2010-09-16
User Interface for an Electron Microscope
App 20100194874 - Bierhoff; Mart Petrus Maria ;   et al.
2010-08-05
Compact Scanning Electron Microscope
App 20100171037 - Bierhoff; Mart Petrus Maria ;   et al.
2010-07-08
Hermetically Sealed Housing With Electrical Feed-in
App 20090200489 - Tappel; Hendrik Gezinus ;   et al.
2009-08-13
Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
Grant 7,474,419 - Tappel , et al. January 6, 2
2009-01-06
Method for the removal of a microscopic sample from a substrate
Grant 7,408,178 - Tappel August 5, 2
2008-08-05
Cluster tool for microscopic processing of samples
Grant 7,301,157 - Buijsse , et al. November 27, 2
2007-11-27
Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
App 20070125958 - Tappel; Hendrik Gezinus ;   et al.
2007-06-07
Method and apparatus for manipulating a microscopic sample
Grant 7,005,636 - Tappel February 28, 2
2006-02-28
Method for the removal of a microscopic sample from a substrate
App 20060017016 - Tappel; Hendrik Gezinus
2006-01-26
Method for the manufacture and transmissive irradiation of a sample, and particle-optical system
Grant 6,963,068 - Asselbergs , et al. November 8, 2
2005-11-08
Method of expeditiously using a focused-beam apparatus to extract samples for analysis from workpieces
App 20050054115 - Von Harrach, Hanno Sebastian ;   et al.
2005-03-10
Method and apparatus for manipulating a microscopic sample
App 20040251412 - Tappel, Hendrik Gezinus
2004-12-16
Method for the manufacture and transmissive irradiation of a sample, and particle-optical system
App 20040144924 - Asselbergs, Peter Emile Stephan Joseph ;   et al.
2004-07-29

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