loadpatents
name:-0.020936012268066
name:-0.014533042907715
name:-0.0030519962310791
Tanuki; Tomikazu Patent Filings

Tanuki; Tomikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tanuki; Tomikazu.The latest application filed is for "haul vehicle control system and haul vehicle management method".

Company Profile
2.18.24
  • Tanuki; Tomikazu - Fujisawa JP
  • Tanuki; Tomikazu - Tokyo JP
  • TANUKI; Tomikazu - Fujisawa-shi JP
  • Tanuki, Tomikazu - Kanagawa JP
  • Tanuki; Tomikazu - Hiratsuka JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Mining machine, management system of mining machine, and management method of mining machine
Grant 10,800,406 - Awamori , et al. October 13, 2
2020-10-13
Haul Vehicle Control System And Haul Vehicle Management Method
App 20200026305 - Maekawa; Takashi ;   et al.
2020-01-23
Perimeter monitoring device for work vehicle
Grant 10,321,097 - Mitsuta , et al.
2019-06-11
Dump truck periphery monitoring apparatus
Grant 9,956,915 - Mitsuta , et al. May 1, 2
2018-05-01
Dump Truck
App 20170120823 - MITSUTA; Shinji ;   et al.
2017-05-04
Work vehicle periphery monitoring apparatus
Grant 9,597,997 - Mitsuta , et al. March 21, 2
2017-03-21
Perimeter Monitoring Device For Work Vehicle
App 20170026618 - MITSUTA; Shinji ;   et al.
2017-01-26
Perimeter monitoring device for work vehicle
Grant 9,497,422 - Mitsuta , et al. November 15, 2
2016-11-15
Work vehicle periphery monitoring system and work vehicle
Grant 9,457,719 - Tanuki , et al. October 4, 2
2016-10-04
Dump truck with obstacle detection mechanism and method for detecting obstacle
Grant 9,442,194 - Kurihara , et al. September 13, 2
2016-09-13
Mining Machine, Management System Of Mining Machine, And Management Method Of Mining Machine
App 20160185346 - Awamori; Katsuki ;   et al.
2016-06-30
Working vehicle periphery monitoring system and working vehicle
Grant 9,294,736 - Tanuki , et al. March 22, 2
2016-03-22
Dump truck
Grant 9,291,709 - Mitsuta , et al. March 22, 2
2016-03-22
Load display device for dump truck
Grant 9,204,106 - Mitsuta , et al. December 1, 2
2015-12-01
Work Vehicle Periphery Monitoring System And Work Vehicle
App 20150217691 - Tanuki; Tomikazu ;   et al.
2015-08-06
Working Vehicle Periphery Monitoring System And Working Vehicle
App 20150222858 - Tanuki; Tomikazu ;   et al.
2015-08-06
Dump Truck
App 20150077281 - Taniguchi; Jun ;   et al.
2015-03-19
Surrounding area monitoring device for work vehicle
Grant 8,982,212 - Mitsuta , et al. March 17, 2
2015-03-17
Dump Truck With Obstacle Detection Mechanism And Method For Detecting Obstacle
App 20140375503 - Kurihara; Takeshi ;   et al.
2014-12-25
Dump Truck With Obstacle Detection Mechanism And Method For Detecting Obstacle
App 20140266859 - Kurihara; Takeshi ;   et al.
2014-09-18
Dump Truck
App 20130169469 - Mitsuta; Shinji ;   et al.
2013-07-04
SURROUNDING AREA MONITORING DEVICE FOR WORK VEHICLE (as amended)
App 20130162830 - Mitsuta; Shinji ;   et al.
2013-06-27
Work Vehicle Periphery Monitoring Apparatus
App 20130155240 - Mitsuta; Shinji ;   et al.
2013-06-20
Surrounding Area Monitoring Device For Work Vehicle
App 20130155241 - Tanuki; Tomikazu ;   et al.
2013-06-20
Perimeter Monitoring Device For Work Vehicle
App 20130147958 - Mitsuta; Shinji ;   et al.
2013-06-13
Work Vehicle Periphery Monitoring Apparatus
App 20130141581 - Mitsuta; Shinji ;   et al.
2013-06-06
Load Display Device For Dump Truck
App 20130120579 - MIitsuta; Shinji ;   et al.
2013-05-16
Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface
Grant 7,383,156 - Matsusita , et al. June 3, 2
2008-06-03
Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface
App 20040036863 - Matsusita, Kouzou ;   et al.
2004-02-26
Inspection apparatus for semiconductor packages
Grant 6,005,965 - Tsuda , et al. December 21, 1
1999-12-21

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