Tanji; Takayoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tanji; Takayoshi.The latest application filed is for "spherical aberration corrector for electromagnetic lens for charged particle beam".
- Tanji; Takayoshi - Nagoya JP
- TANJI; Takayoshi - Nagoya-shi JP
- Tanji, Takayoshi - Nagoya City JP
| Patent | Date |
|---|---|
| Spherical aberration corrector for electromagnetic lens for charged particle beam Grant 10,096,448 - Kawasaki , et al. October 9, 2 | 2018-10-09 |
| Spherical Aberration Corrector For Electromagnetic Lens For Charged Particle Beam App 20180114670 - KAWASAKI; Tadahiro ; et al. | 2018-04-26 |
| Transmission electron microscope and three-dimensional observing method Grant 7,012,253 - Tanji March 14, 2 | 2006-03-14 |
| Transmission electron microscope and three-dimensional observing method App 20040144923 - Tanji, Takayoshi | 2004-07-29 |
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