TANIZAKI; Hiroyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for TANIZAKI; Hiroyuki.The latest application filed is for "modeling method".

Company Profile

0.11.8

TANIZAKI; Hiroyuki - Nagoya Aichi JP
TANIZAKI; Hiroyuki - Yokkaichi Mie JP
Tanizaki; Hiroyuki - Yokkaichi JP
Tanizaki; Hiroyuki - Mie JP
Tanizaki; Hiroyuki - Kanagawa JP
Tanizaki; Hiroyuki - Kanagawa-ken JP
Tanizaki; Hiroyuki - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Modeling Method App 20220302102 - MIURA; Shimpei ; et al.	2022-09-22
Measuring Device, Measuring Method, And Semiconductor Storage Device App 20220068678 - TANIZAKI; Hiroyuki	2022-03-03
Substrate treatment apparatus and method of manufacturing semiconductor device Grant 11,171,022 - Kitagawa , et al. November 9, 2	2021-11-09
Substrate Treatment Apparatus And Method Of Manufacturing Semiconductor Device App 20200066550 - KITAGAWA; Hakuba ; et al.	2020-02-27
Inspection system and method for inspecting line width and/or positional errors of a pattern Grant 9,406,117 - Touya , et al. August 2, 2	2016-08-02
Focus Correction Method, Focus Correction Apparatus And Non-transitory Computer-readable Recording Medium App 20160041479 - TANIZAKI; Hiroyuki	2016-02-11
Inspection System And Method For Inspecting Line Width And/or Positional Errors Of A Pattern App 20150193918 - TOUYA; Takanao ; et al.	2015-07-09
Inspection system and method for inspecting line width and/or positional errors of a pattern Grant 9,036,896 - Touya , et al. May 19, 2	2015-05-19
Pattern inspection device and method of inspecting pattern Grant 8,358,340 - Yoshikawa , et al. January 22, 2	2013-01-22
Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatus Grant 8,320,658 - Tanizaki , et al. November 27, 2	2012-11-27
Inspection System And Method For Inspecting Line Width And/or Positional Errors Of A Pattern App 20110255770 - Touya; Takanao ; et al.	2011-10-20
Pattern Inspection Device And Method Of Inspecting Pattern App 20090303323 - Yoshikawa; Ryoji ; et al.	2009-12-10
Unevenness Inspection Method, Method For Manufacturing Display Panel, And Unevenness Inspection Apparatus App 20080063254 - Tanizaki; Hiroyuki ; et al.	2008-03-13
Sliding lock mechanism for rotary seat assembly Grant 4,570,997 - Tanizaki , et al. February 18, 1	1986-02-18
Seat device Grant 4,496,189 - Tanizaki , et al. January 29, 1	1985-01-29
Rotatable seat for an automotive vehicle Grant 4,487,452 - Tanizaki , et al. December 11, 1	1984-12-11
Sliding mechanism for vehicle sliding door Grant 4,152,872 - Tanizaki , et al. May 8, 1	1979-05-08

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