Tanioka; Michinobu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tanioka; Michinobu.The latest application filed is for "semiconductor device".

Company Profile

0.10.13

Tanioka; Michinobu - Minato-ku JP
Tanioka; Michinobu - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coil Grant 7,906,846 - Hoshino , et al. March 15, 2	2011-03-15
Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus Grant 7,852,101 - Tanioka , et al. December 14, 2	2010-12-14
Semiconductor Device App 20090278246 - Hoshino; Shigeki ; et al.	2009-11-12
Inspection probe Grant 7,548,082 - Tanioka , et al. June 16, 2	2009-06-16
Semiconductor Device Testing Apparatus and Power Supply Unit App 20080265933 - Tanioka; Michinobu ; et al.	2008-10-30
Inspection probe, method for preparing the same, and method for inspecting elements Grant 7,218,131 - Tanioka , et al. May 15, 2	2007-05-15
Inspection probe App 20060208752 - Tanioka; Michinobu ; et al.	2006-09-21
Inspection probe, method for preparing the same, and method for inspecting elements App 20060082380 - Tanioka; Michinobu ; et al.	2006-04-20
Semiconductor device inspection apparatus and inspection method Grant 6,906,546 - Tanioka , et al. June 14, 2	2005-06-14
Semiconductor device inspection apparatus and inspection method App 20040100297 - Tanioka, Michinobu ; et al.	2004-05-27
Probe for inspecting semiconductor device and method of manufacturing the same Grant 6,667,627 - Tanioka , et al. December 23, 2	2003-12-23
Test probe having a sheet body App 20030030455 - Tanioka, Michinobu ; et al.	2003-02-13
Probe for inspecting semiconductor device and method of manufacturing the same App 20020125901 - Tanioka, Michinobu ; et al.	2002-09-12
Surface Elastic Wave Device Having Bumps In A Definite Area On The Device And Method For Manufacturing The Same App 20020057034 - ISHIKAWA, MITSURU ; et al.	2002-05-16
Probe structure and method for manufacturing the same App 20020053917 - Tanioka, Michinobu ; et al.	2002-05-09
Semiconductor device testing apparatus App 20020036514 - Taura, Toru ; et al.	2002-03-28
Bare chip carrier and method of checking the bare chip App 20020012233 - Tanioka, Michinobu ; et al.	2002-01-31
Electric Contact Device For Testing Semiconductor Device App 20010040464 - TANIOKA, MICHINOBU ; et al.	2001-11-15
Semiconductor device tester and method of testing semiconductor device App 20010033010 - Tanioka, Michinobu ; et al.	2001-10-25
Surface acoustic wave device mounted with a resin film and method of making same Grant 6,078,229 - Funada , et al. June 20, 2	2000-06-20
Structure and method for mounting a saw device Grant 6,078,123 - Tanaka , et al. June 20, 2	2000-06-20
Semiconductor device with improved connection reliability Grant 6,013,953 - Nishihara , et al. January 11, 2	2000-01-11
MCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array form Grant 5,784,264 - Tanioka July 21, 1	1998-07-21

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