Tanimura; Masaaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tanimura; Masaaki.The latest application filed is for "semiconductor device and burn-in test method thereof".

Company Profile

1.8.8

Tanimura; Masaaki - Tokyo JP
TANIMURA; Masaaki - Kanagawa JP
Tanimura; Masaaki - Hyogo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device and burn-in test method thereof Grant 11,372,042 - Suzuki , et al. June 28, 2	2022-06-28
Semiconductor Device And Burn-in Test Method Thereof App 20210123972 - SUZUKI; Koji ; et al.	2021-04-29
A/D converter and semiconductor device Grant 10,608,659 - Tanaka , et al.	2020-03-31
A/d Converter And Semiconductor Device App 20190386671 - TANAKA; Yasuyuki ; et al.	2019-12-19
Semiconductor Integrated Circuit Device And Manufacturing Method Of Electronic Device Using The Same App 20150365049 - OZAWA; Osamu ; et al.	2015-12-17
Semiconductor integrated circuit and test system for testing the same App 20070198885 - Tanimura; Masaaki	2007-08-23
Semiconductor integrated circuit and test system for testing the same Grant 7,222,279 - Tanimura May 22, 2	2007-05-22
Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals Grant 6,784,684 - Tanimura August 31, 2	2004-08-31
Apparatus and method of inspecting semiconductor integrated circuit Grant 6,774,657 - Hashimoto , et al. August 10, 2	2004-08-10
Semiconductor integrated circuit and test system for testing the same App 20040143782 - Tanimura, Masaaki	2004-07-22
Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same Grant 6,750,672 - Tanimura , et al. June 15, 2	2004-06-15
Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals App 20030057940 - Tanimura, Masaaki	2003-03-27
Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same App 20030016045 - Tanimura, Masaaki ; et al.	2003-01-23
Semiconductor integrated circuit and method for testing the same Grant 6,479,363 - Tanimura November 12, 2	2002-11-12
Apparatus and method of inspecting semiconductor integrated circuit App 20010050569 - Hashimoto, Osamu ; et al.	2001-12-13
Synchronous semiconductor memory device in which current consumed by input buffer circuit is reduced Grant 5,880,998 - Tanimura , et al. March 9, 1	1999-03-09

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