loadpatents
name:-0.075706958770752
name:-0.23622012138367
name:-0.014504194259644
Tanimoto; Kenji Patent Filings

Tanimoto; Kenji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tanimoto; Kenji.The latest application filed is for "pattern measurement device and pattern measurement method".

Company Profile
11.50.59
  • Tanimoto; Kenji - Tokyo JP
  • TANIMOTO; KENJI - Hyogo JP
  • TANIMOTO; Kenji - Hitachinaka JP
  • Tanimoto; Kenji - Toyama JP
  • Tanimoto; Kenji - Nei-gun JP
  • Tanimoto; Kenji - Osaka JP
  • Tanimoto; Kenji - Toyama-shi JP
  • Tanimoto; Kenji - Hiroshima-shi JP
  • Tanimoto; Kenji - Sakai JP
  • Tanimoto, Kenji - Sakai-shi JP
  • Tanimoto; Kenji - Kobe JP
  • Tanimoto; Kenji - Toyama-ken JP
  • Tanimoto; Kenji - Funabashi JP
  • Tanimoto; Kenji - Kanagawa JP
  • Tanimoto; Kenji - Minoo JA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Pattern Measurement Device and Pattern Measurement Method
App 20220260930 - Yamamoto; Takuma ;   et al.
2022-08-18
Pattern measurement device and pattern measurement method
Grant 11,353,798 - Yamamoto , et al. June 7, 2
2022-06-07
Charged Particle Beam Device
App 20220130638 - HITOMI; Keiichiro ;   et al.
2022-04-28
Scanning electron microscope and method for measuring pattern
Grant 11,276,554 - Ohashi , et al. March 15, 2
2022-03-15
Scanning electron microscope
Grant 11,251,018 - Sohda , et al. February 15, 2
2022-02-15
Electron Microscope And Method Of Adjusting Focus Of Electron Microscope
App 20210384006 - Ohashi; Takeyoshi ;   et al.
2021-12-09
Scanning Electron Microscope
App 20210272770 - SOHDA; Yasunari ;   et al.
2021-09-02
Scanning Electron Microscope And Method For Measuring Pattern
App 20210043420 - Ohashi; Takeyoshi ;   et al.
2021-02-11
Charged particle beam device
Grant 10,903,037 - Kasuya , et al. January 26, 2
2021-01-26
Stator And Motor
App 20200358323 - SAITOH; MITSUO ;   et al.
2020-11-12
Pattern measurement device and pattern measurement method
Grant 10,816,332 - Ohta , et al. October 27, 2
2020-10-27
Pattern Measurement Device and Pattern Measurement Method
App 20200292308 - OHTA; Hiroya ;   et al.
2020-09-17
Pattern Measurement Device and Pattern Measurement Method
App 20200278615 - YAMAMOTO; Takuma ;   et al.
2020-09-03
Charged particle beam apparatus
Grant 10,636,618 - Bizen , et al.
2020-04-28
Charged particle beam device
Grant 10,629,408 - Kameda , et al.
2020-04-21
Charged Particle Beam Device
App 20200090897 - KASUYA; Keigo ;   et al.
2020-03-19
Charged Particle Beam Device
App 20190221400 - KAMEDA; Toshimasa ;   et al.
2019-07-18
Charged Particle Beam Apparatus
App 20190066969 - BIZEN; Kaori ;   et al.
2019-02-28
Charged particle beam device, and method of manufacturing component for charged particle beam device
Grant 10,170,273 - Ichimura , et al. J
2019-01-01
Charged Particle Beam Device, and Method of Manufacturing Component for Charged Particle Beam Device
App 20180019096 - ICHIMURA; Takashi ;   et al.
2018-01-18
Charged particle beam device and overlay misalignment measurement method
Grant 9,224,575 - Yamamoto , et al. December 29, 2
2015-12-29
Charged Particle Beam Device and Overlay Misalignment Measurement Method
App 20150287569 - Yamamoto; Takuma ;   et al.
2015-10-08
Electron Beam Apparatus And Lens Array
App 20130248731 - TANIMOTO; Sayaka ;   et al.
2013-09-26
Charged particle beam apparatus and method for stably obtaining charged particle beam image
Grant 8,536,540 - Suzuki , et al. September 17, 2
2013-09-17
Production method of polishing composition
Grant 8,323,368 - Takakuma , et al. December 4, 2
2012-12-04
Charged Particle Beam Apparatus And Method For Stably Obtaining Charged Particle Beam Image
App 20120126118 - Suzuki; Makoto ;   et al.
2012-05-24
Cerium oxide sol and abrasive
Grant 7,887,714 - Ota , et al. February 15, 2
2011-02-15
Refrigeration system
Grant 7,765,817 - Takegami , et al. August 3, 2
2010-08-03
Refrigeration apparatus
Grant 7,752,864 - Takegami , et al. July 13, 2
2010-07-13
Refrigeration apparatus
App 20100139312 - Takegami; Masaaki ;   et al.
2010-06-10
Semiconductor wafer inspection tool and semiconductor wafer inspection method
Grant 7,728,294 - Hiroi , et al. June 1, 2
2010-06-01
Charge control apparatus and measurement apparatus equipped with the charge control apparatus
Grant 7,683,319 - Makino , et al. March 23, 2
2010-03-23
Production method of polishing composition
Grant 7,678,703 - Takakura , et al. March 16, 2
2010-03-16
Inspection apparatus and inspection method
Grant 7,652,248 - Makino , et al. January 26, 2
2010-01-26
Refrigeration System
App 20090282848 - Takegami; Masaaki ;   et al.
2009-11-19
Abrasive compound for glass hard disk platter
Grant 7,578,862 - Ota , et al. August 25, 2
2009-08-25
Charge control apparatus and measurement apparatus equipped with the charge control apparatus
App 20090166557 - Makino; Hiroshi ;   et al.
2009-07-02
Method of manufacturing display panel, and supporting bed for substrate of the display panel
Grant 7,534,155 - Yonehara , et al. May 19, 2
2009-05-19
Refrigeration System
App 20090120113 - Takegami; Masaaki ;   et al.
2009-05-14
Refrigerating Apparatus
App 20090077985 - Takegami; Masaaki ;   et al.
2009-03-26
Production method of polishing composition
App 20090042393 - Takakuma; Noriyuki ;   et al.
2009-02-12
Refrigeration System
App 20090031737 - Ueno; Takeo ;   et al.
2009-02-05
Method of milling cerium compound by means of ball mill
Grant 7,484,679 - Ota , et al. February 3, 2
2009-02-03
Refrigerartion apparatus
App 20090007589 - Takegami; Masaaki ;   et al.
2009-01-08
Refrigerating Apparatus
App 20080282728 - Takegami; Masaaki ;   et al.
2008-11-20
Production Method of Polishing Composition
App 20080254718 - Takakuma; Noriyuki ;   et al.
2008-10-16
Charged particle beam apparatus
Grant 7,435,960 - Suzuki , et al. October 14, 2
2008-10-14
Cerium oxide particles and production method therefor
Grant 7,431,758 - Ota , et al. October 7, 2
2008-10-07
Subcooling Apparatus
App 20080229769 - Takegami; Masaaki ;   et al.
2008-09-25
Refrigerating Apparatus
App 20080229782 - Takegami; Masaaki ;   et al.
2008-09-25
Method of inspecting a circuit pattern and inspecting instrument
Grant 7,397,031 - Shinada , et al. July 8, 2
2008-07-08
Method of milling cerium compound by means of ball mill
App 20080156908 - Ota; Isao ;   et al.
2008-07-03
Refrigerating Apparatus
App 20080110199 - Takegami; Masaaki ;   et al.
2008-05-15
Semiconductor wafer inspection tool and semiconductor wafer inspection method
App 20080067381 - Hiroi; Takashi ;   et al.
2008-03-20
Refrigeration System
App 20080034765 - Takegami; Masaaki ;   et al.
2008-02-14
Pattern Inspection And Measurement Apparatus
App 20080017797 - CHENG; Zhaohui ;   et al.
2008-01-24
Osteoporosis Diagnosis Support Device
App 20070286467 - Asano; Akira ;   et al.
2007-12-13
Composition for Polishing
App 20070240366 - Ota; Isao ;   et al.
2007-10-18
Charged particle beam apparatus
App 20070241278 - Suzuki; Makoto ;   et al.
2007-10-18
Inspection Apparatus and Inspection Method
App 20070228276 - MAKINO; HIROSHI ;   et al.
2007-10-04
Method of manufacturing display panel, and supporting bed for substrate of the display panel
App 20070167102 - Yonehara; Hiroyuki ;   et al.
2007-07-19
Refrigeration system
App 20070157650 - Takegami; Masaaki ;   et al.
2007-07-12
Charged particle beam apparatus
Grant 7,241,996 - Suzuki , et al. July 10, 2
2007-07-10
Refrigeration apparatus
Grant 7,237,405 - Takegami , et al. July 3, 2
2007-07-03
Refrigeration system
App 20070137231 - Takegami; Masaaki ;   et al.
2007-06-21
Refrigerating apparatus
App 20070074523 - Takegami; Masaaki ;   et al.
2007-04-05
Supercooling apparatus
App 20070022777 - Takegami; Masaaki ;   et al.
2007-02-01
Refrigerating apparatus
Grant 7,155,928 - Takegami , et al. January 2, 2
2007-01-02
Method of inspecting a circuit pattern and inspecting instrument
App 20060243908 - Shinada; Hiroyuki ;   et al.
2006-11-02
Method of inspecting a circuit pattern and inspecting instrument
Grant 7,098,455 - Shinada , et al. August 29, 2
2006-08-29
Cerium oxide particles and process for the production therefor
App 20060150526 - Ota; Isao ;   et al.
2006-07-13
Freezer
App 20060123835 - Takegami; Masaaki ;   et al.
2006-06-15
Refrigeration equipment
Grant 7,028,502 - Takegami , et al. April 18, 2
2006-04-18
Charged particle beam apparatus
App 20060016990 - Suzuki; Makoto ;   et al.
2006-01-26
Refrigerator
Grant 6,986,259 - Takegami , et al. January 17, 2
2006-01-17
Cerium compound milling method using ball mill
App 20050253001 - Ota, Isao ;   et al.
2005-11-17
Refrigerating device
Grant 6,938,430 - Tanimoto , et al. September 6, 2
2005-09-06
Refrigerating equipment
App 20050150246 - Takegami, Masaaki ;   et al.
2005-07-14
Refrigeration equipment
App 20050115271 - Takegami, Masaaki ;   et al.
2005-06-02
Cerium oxide sol and abrasive
Grant 6,887,289 - Ota , et al. May 3, 2
2005-05-03
Freezer
Grant 6,883,346 - Tanimoto , et al. April 26, 2
2005-04-26
Regrigeration equipment
App 20040237578 - Takegami, Masaaki ;   et al.
2004-12-02
Cerium oxide sol and abrasive
App 20040223898 - Ota, Isao ;   et al.
2004-11-11
Refrigerator
App 20040159111 - Takegami, Masaaki ;   et al.
2004-08-19
Regfrigerating device
App 20040112082 - Tanimoto, Kenji ;   et al.
2004-06-17
Freezer
App 20040093893 - Tanimoto, Kenji ;   et al.
2004-05-20
Refrigeration system
Grant 6,722,156 - Tanimoto , et al. April 20, 2
2004-04-20
Abrasive compound for glass hard disk platter
App 20040065023 - Ota, Isao ;   et al.
2004-04-08
Crystalline ceric oxide sol and process for producing the same
Grant 6,706,082 - Ota , et al. March 16, 2
2004-03-16
Freezing device
Grant 6,698,217 - Tanimoto , et al. March 2, 2
2004-03-02
Freezing Device
App 20030233836 - Tanimoto, Kenji ;   et al.
2003-12-25
Refrigeration System
App 20030226370 - Tanimoto, Kenji ;   et al.
2003-12-11
Method of inspecting a circuit pattern and inspecting instrument
App 20030201391 - Shinada, Hiroyuki ;   et al.
2003-10-30
Method of inspecting a circuit pattern and inspecting instrument
Grant 6,583,413 - Shinada , et al. June 24, 2
2003-06-24
Crystalline ceric oxide sol and process for producing the same
App 20030007920 - Ota, Isao ;   et al.
2003-01-09
Cerium oxide sol and abrasive
App 20020086618 - Ota, Isao ;   et al.
2002-07-04
Polishing abrasive of crystalline ceric oxide particles having surfaces modified with hydroxyl groups
Grant 6,372,003 - Kasai , et al. April 16, 2
2002-04-16
Gas floating apparatus, gas floating-transporting apparatus, and thermal treatment apparatus
Grant 6,336,775 - Morita , et al. January 8, 2
2002-01-08
Refrigerator for container
Grant 6,119,471 - Tanaka , et al. September 19, 2
2000-09-19
Process for producing crystalline ceric oxide particles and abrasive
Grant 5,962,343 - Kasai , et al. October 5, 1
1999-10-05
Elongated-shaped silica sol and method for preparing the same
Grant 5,221,497 - Watanabe , et al. June 22, 1
1993-06-22
Production of stable aqueous silica sol
Grant 5,196,177 - Watanabe , et al. March 23, 1
1993-03-23
Auxiliary scanning control system for facsimile
Grant 4,464,682 - Etoh , et al. August 7, 1
1984-08-07
Process for producing alkylnaphthalenes
Grant 3,985,819 - Kobayashi , et al. October 12, 1
1976-10-12
Process for the continuous production of dihydroperoxides
Grant 3,953,521 - Suda , et al. April 27, 1
1976-04-27
Aluminum catalysts
Grant 3,952,037 - Yoshitake , et al. April 20, 1
1976-04-20
Process for the cleavage of hydroperoxides
Grant 3,928,469 - Suda , et al. December 23, 1
1975-12-23
Pulse Phase Double Modulation System For Respectively Modulating The Leading And Trailing Edges Of A Carrier Pulse With Two Different Information Signals
Grant 3,862,363 - Tanimoto January 21, 1
1975-01-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed