Taniguchi; Yuzo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taniguchi; Yuzo.The latest application filed is for "method of making gas discharge display panel and gas discharge display device".

Company Profile

0.8.6

Taniguchi; Yuzo - Kodaira JP
Taniguchi; Yuzo - Higashimurayama JP
Taniguchi, Yuzo - Tokyo JP
Taniguchi, Yuzo - Kodaira-shi JP
Taniguchi, Yuzo - Higashimurayama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system Grant 6,650,409 - Noguchi , et al. November 18, 2	2003-11-18
Inspection data analyzing system Grant 6,628,817 - Ishikawa , et al. September 30, 2	2003-09-30
Method of making gas discharge display panel and gas discharge display device Grant 6,624,575 - Nishiki , et al. September 23, 2	2003-09-23
Wiring substrate and gas discharge display device Grant 6,621,217 - Nishiki , et al. September 16, 2	2003-09-16
Process for manufacturing electronic circuit devices Grant 6,471,115 - Ijuin , et al. October 29, 2	2002-10-29
Method of making gas discharge display panel and gas discharge display device App 20020089285 - Nishiki, Masashi ; et al.	2002-07-11
Wiring substrate and gas discharge display device App 20020070665 - Nishiki, Masashi ; et al.	2002-06-13
Inspection data analyzing system App 20020034326 - Ishikawa, Seiji ; et al.	2002-03-21
Wiring substrate and gas discharge display device App 20020014841 - Nishiki, Masashi ; et al.	2002-02-07
Inspection data analyzing system App 20010038708 - Ishikawa, Seiji ; et al.	2001-11-08
Inspection data analyzing system App 20010001015 - Ishikawa, Seiji ; et al.	2001-05-10
Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device Grant 6,185,322 - Ishikawa , et al. February 6, 2	2001-02-06
Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line Grant 5,274,434 - Morioka , et al. December 28, 1	1993-12-28
Pattern defect inspection apparatus Grant 4,731,855 - Suda , et al. March 15, 1	1988-03-15

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