Taniguchi; Yoshifumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Taniguchi; Yoshifumi.The latest application filed is for "electron microscope and imaging method".

Company Profile

3.24.19

Taniguchi; Yoshifumi - Tokyo JP
TANIGUCHI; Yoshifumi - Okayama-shi Okayama
Taniguchi; Yoshifumi - Hitachinaka N/A JP
Taniguchi; Yoshifumi - Okayama JP
Taniguchi; Yoshifumi - Ibaraki-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device for moving an aperture having plurality of openings and sample observation method Grant 10,636,621 - Hanawa , et al.	2020-04-28
Electron microscope and imaging method Grant 10,535,497 - Tamaki , et al. Ja	2020-01-14
Electron Microscope And Imaging Method App 20190131107 - TAMAKI; Hirokazu ; et al.	2019-05-02
Charged Particle Beam Device and Sample Observation Method App 20180076004 - HANAWA; Akinari ; et al.	2018-03-15
Electron microscope Grant 9,679,738 - Matsumoto , et al. June 13, 2	2017-06-13
Sample holder for electron microscope Grant 9,558,910 - Terada , et al. January 31, 2	2017-01-31
Electron Microscope App 20160196952 - MATSUMOTO; Hiroaki ; et al.	2016-07-07
Agent For Lifestyle-related Disease And Oral Composition Comprising Same App 20160008392 - TANIGUCHI; Yoshifumi ; et al.	2016-01-14
Sample Holder For Electron Microscope App 20140353499 - Terada; Shohei ; et al.	2014-12-04
Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image Grant 8,530,858 - Terada , et al. September 10, 2	2013-09-10
Transmission electron microscope having electron spectrometer Grant 8,436,301 - Terada , et al. May 7, 2	2013-05-07
Transmission electron microscope having electron spectroscope Grant 8,263,936 - Terada , et al. September 11, 2	2012-09-11
Transmission Electron Microscope Having Electron Spectrometer App 20110240854 - Terada; Shohei ; et al.	2011-10-06
Electron microscope Grant D636,005 - Oonuma , et al. April 12, 2	2011-04-12
Charged particle beam apparatus and specimen holder Grant 7,812,310 - Tanaka , et al. October 12, 2	2010-10-12
Transmission electron microscope provided with electronic spectroscope Grant 7,723,682 - Terada , et al. May 25, 2	2010-05-25
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus Grant 7,622,714 - Yaguchi , et al. November 24, 2	2009-11-24
Immunoregulatory Agent App 20090270342 - Hino; Keiko ; et al.	2009-10-29
Transmission Electron Microscope Having Electron Spectroscope App 20090242766 - TERADA; Shohei ; et al.	2009-10-01
Charged particle beam apparatus and specimen holder App 20080315097 - Tanaka; Hiroyuki ; et al.	2008-12-25
Transmission Electron Microscope Provided with Electronic Spectroscope App 20080203296 - TERADA; Shohei ; et al.	2008-08-28
Method and apparatus for measuring the physical properties of micro region Grant 7,385,198 - Taniguchi , et al. June 10, 2	2008-06-10
Charged particle beam apparatus and specimen holder Grant 7,381,968 - Tanaka , et al. June 3, 2	2008-06-03
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus App 20080073521 - Yaguchi; Toshie ; et al.	2008-03-27
Transmission electron microscope and image observation method using it Grant 7,235,784 - Taniguchi , et al. June 26, 2	2007-06-26
Method and apparatus for measuring the physical properties of micro region App 20060113473 - Taniguchi; Yoshifumi ; et al.	2006-06-01
Transmission electron microscope and image observation method using it App 20060076492 - Taniguchi; Yoshifumi ; et al.	2006-04-13
Method and apparatus for measuring physical properties of micro region Grant 7,022,988 - Taniguchi , et al. April 4, 2	2006-04-04
Material characterization system Grant 6,992,286 - Yaguchi , et al. January 31, 2	2006-01-31
Charged particle beam apparatus and specimen holder App 20050230636 - Tanaka, Hiroyuki ; et al.	2005-10-20
Electron microscope Grant 6,930,306 - Kaji , et al. August 16, 2	2005-08-16
Method and apparatus for observing element distribution Grant 6,855,927 - Taniguchi , et al. February 15, 2	2005-02-15
Electron microscope App 20040188613 - Kaji, Kazutoshi ; et al.	2004-09-30
Material characterization system App 20040183012 - Yaguchi, Toshie ; et al.	2004-09-23
Observation apparatus and observation method using an electron beam Grant 6,750,451 - Koguchi , et al. June 15, 2	2004-06-15
Method and apparatus for measuring physical properties of micro region App 20040061053 - Taniguchi, Yoshifumi ; et al.	2004-04-01
Method and apparatus for observing element distribution App 20040000641 - Taniguchi, Yoshifumi ; et al.	2004-01-01
Observation apparatus and observation method using an electron beam App 20030006373 - Koguchi, Masanari ; et al.	2003-01-09
Energy filter and electron microscope equipped with the energy filter Grant 6,150,657 - Kimoto , et al. November 21, 2	2000-11-21
Electron energy filter and transmission electron microscope provided with the same Grant 5,585,630 - Taniguchi , et al. December 17, 1	1996-12-17
Transmission electron microscope and method of observing element distribution by using the same Grant 5,578,823 - Taniguchi November 26, 1	1996-11-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.