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name:-0.0076630115509033
name:-0.0086848735809326
name:-0.012730836868286
Tang; Minghao Patent Filings

Tang; Minghao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tang; Minghao.The latest application filed is for "device for preparing electrode assembly and preparation method of electrode assembly".

Company Profile
12.7.7
  • Tang; Minghao - Ballston Lake NY
  • TANG; Minghao - Ningde City Fujian
  • Tang; Minghao - Ballston Court NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Self-referencing and self-calibrating interference pattern overlay measurement
Grant 11,231,654 - Yang , et al. January 25, 2
2022-01-25
Device For Preparing Electrode Assembly And Preparation Method Of Electrode Assembly
App 20210376371 - LIANG; Chengdu ;   et al.
2021-12-02
Structure and method to improve overlay performance in semiconductor devices
Grant 10,833,022 - Tran , et al. November 10, 2
2020-11-10
Self-referencing And Self-calibrating Interference Pattern Overlay Measurement
App 20200241429 - Yang; Dongyue ;   et al.
2020-07-30
Self-referencing and self-calibrating interference pattern overlay measurement
Grant 10,705,435 - Yang , et al.
2020-07-07
Asymmetric overlay mark for overlay measurement
Grant 10,707,175 - Zhao , et al.
2020-07-07
Structure And Method To Improve Overlay Performance In Semiconductor Devices
App 20200051923 - Tran; Cung D. ;   et al.
2020-02-13
Structure and method to improve overlay performance in semiconductor devices
Grant 10,504,851 - Tran , et al. Dec
2019-12-10
Asymmetric Overlay Mark For Overlay Measurement
App 20190363053 - Zhao; Wei ;   et al.
2019-11-28
Structure And Method To Improve Overlay Performance In Semiconductor Devices
App 20190267329 - Tran; Cung D. ;   et al.
2019-08-29
Multiple patterning with mandrel cuts formed using a block mask
Grant 10,395,926 - Tang , et al. A
2019-08-27
Self-referencing And Self-calibrating Interference Pattern Overlay Measurement
App 20190219930 - Yang; Dongyue ;   et al.
2019-07-18
Interconnects With Cuts Formed By Block Patterning
App 20190181040 - Tang; Minghao ;   et al.
2019-06-13
Interconnects with cuts formed by block patterning
Grant 10,319,626 - Tang , et al.
2019-06-11

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