| Patent | Date |
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Physical failure analysis-oriented diagnosis resolution prediction
Grant 11,227,091 - Tang , et al. January 18, 2 | 2022-01-18 |
Diagnosis resolution prediction
Grant 11,042,679 - Tang , et al. June 22, 2 | 2021-06-22 |
Cell-aware diagnostic pattern generation for logic diagnosis
Grant 10,795,751 - Tang , et al. October 6, 2 | 2020-10-06 |
Machine Learning-based Adjustments In Volume Diagnosis Procedures For Determination Of Root Cause Distributions
App 20200302321 - Veda; Gaurav ; et al. | 2020-09-24 |
Inter-cell bridge defect diagnosis
Grant 10,657,207 - Tang , et al. | 2020-05-19 |
Cell-aware root cause deconvolution for defect diagnosis and yield analysis
Grant 10,592,625 - Tang , et al. | 2020-03-17 |
Circuit defect diagnosis based on sink cell fault models
Grant 10,234,502 - Tang , et al. | 2019-03-19 |
Cell-Aware Diagnostic Pattern Generation For Logic Diagnosis
App 20180253346 - Tang; Huaxing ; et al. | 2018-09-06 |
Counter-Based Scan Chain Diagnosis
App 20180217204 - Huang; Yu ; et al. | 2018-08-02 |
Dynamic design partitioning for diagnosis
Grant 9,857,421 - Tang , et al. January 2, 2 | 2018-01-02 |
Dynamic Design Partitioning For Diagnosis
App 20160245866 - Tang; Huaxing ; et al. | 2016-08-25 |
Dynamic design partitioning for diagnosis
Grant 9,336,107 - Tang , et al. May 10, 2 | 2016-05-10 |
Dynamic design partitioning for scan chain diagnosis
Grant 9,244,125 - Huang , et al. January 26, 2 | 2016-01-26 |
Cell Internal Defect Diagnosis
App 20150234978 - Tang; Huaxing ; et al. | 2015-08-20 |
Speeding Up Defect Diagnosis Techniques
App 20150135030 - Zou; Wei ; et al. | 2015-05-14 |
Speeding up defect diagnosis techniques
Grant 8,812,922 - Zou , et al. August 19, 2 | 2014-08-19 |
Dynamic Design Partitioning For Scan Chain Diagnosis
App 20140164859 - Huang; Yu ; et al. | 2014-06-12 |
Fault diagnosis based on design partitioning
Grant 8,707,232 - Tang , et al. April 22, 2 | 2014-04-22 |
Dynamic Design Partitioning For Diagnosis
App 20130145213 - Tang; Huaxing ; et al. | 2013-06-06 |
Fault Diagnosis Based On Design Partitioning
App 20130024830 - Tang; Huaxing ; et al. | 2013-01-24 |
Generating test patterns having enhanced coverage of untargeted defects
Grant 8,201,131 - Rajski , et al. June 12, 2 | 2012-06-12 |
Fault dictionaries for integrated circuit yield and quality analysis methods and systems
Grant 7,987,442 - Rajski , et al. July 26, 2 | 2011-07-26 |
Increased Fault Diagnosis Throughput Using Dictionaries For Hyperactive Faults
App 20090287438 - Cheng; Wu-Tung ; et al. | 2009-11-19 |
Determining And Analyzing Integrated Circuit Yield And Quality
App 20090210183 - Rajski; Janusz ; et al. | 2009-08-20 |
Generating Test Patterns Having Enhanced Coverage Of Untargeted Defects
App 20090183128 - Rajski; Janusz ; et al. | 2009-07-16 |
Determining and analyzing integrated circuit yield and quality
Grant 7,512,508 - Rajski , et al. March 31, 2 | 2009-03-31 |
Generating test patterns having enhanced coverage of untargeted defects
Grant 7,509,600 - Rajski , et al. March 24, 2 | 2009-03-24 |
Speeding Up Defect Diagnosis Techniques
App 20070226570 - Zou; Wei ; et al. | 2007-09-27 |
Fault dictionaries for integrated circuit yield and quality analysis methods and systems
App 20060066338 - Rajski; Janusz ; et al. | 2006-03-30 |
Determining and analyzing integrated circuit yield and quality
App 20060066339 - Rajski; Janusz ; et al. | 2006-03-30 |
Integrated circuit yield and quality analysis methods and systems
App 20060053357 - Rajski; Janusz ; et al. | 2006-03-09 |
Generating test patterns having enhanced coverage of untargeted defects
App 20050240887 - Rajski, Janusz ; et al. | 2005-10-27 |
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